High precision fiber taper fabrication using the immersion depth control in chemical etching

Author(s):  
Fei Wu ◽  
Yi Yang ◽  
Stuart Yin
2019 ◽  
Vol 75 (6) ◽  
pp. 833-841 ◽  
Author(s):  
Benjamin Heacock ◽  
Robert Haun ◽  
Katsuya Hirota ◽  
Takuya Hosobata ◽  
Michael G. Huber ◽  
...  

The construction is described of a monolithic thick-crystal perfect silicon neutron interferometer using an ultra-high-precision grinding technique and a combination of annealing and chemical etching that differs from the construction of prior neutron interferometers. The interferometer is the second to have been annealed after machining and the first to be annealed prior to chemical etching. Monitoring the interference signal at each post-fabrication step provides a measurement of subsurface damage and its alleviation. In this case, the strain caused by subsurface damage manifests itself as a spatially varying angular misalignment between the two relevant volumes of the crystal and is reduced from ∼10−5 rad to ∼10−9 rad by way of annealing and chemical etching.


2020 ◽  
Vol 169 ◽  
pp. 105328 ◽  
Author(s):  
Yanling Tian ◽  
Kangkang Lu ◽  
Fujun Wang ◽  
Zhiyong Guo ◽  
Chongkai Zhou ◽  
...  

Photonics ◽  
2021 ◽  
Vol 8 (9) ◽  
pp. 367
Author(s):  
Chaoyang Ti ◽  
Yao Shen ◽  
Yiming Lei ◽  
Yuxiang Liu

Optical trapping of sub−micrometer particles in three dimensions has been attracting increasing attention in a wide variety of fields such as physics, chemistry, and biologics. Optical fibers that allow stable trapping of such particles are not readily available but beneficial in system integration and miniaturization. Here, we present a readily accessible batch fabrication method, namely tubeless fiber pulling assisted chemical etching, to obtain sharp tapered optical fibers from regular telecommunication single−mode fibers. We demonstrated the applications of such fiber tapers in two non−plasmonic optical trapping systems, namely single− and dual−fiber−taper−based trapping systems. We realized single particle trapping, multiple particle trapping, optical binding, and optical guiding with sub−micrometer silica particles. Particularly, using the dual fiber system, we observed the three−dimensional optical trapping of swarm sub−micrometer particles, which is more challenging to realize than trapping a single particle. Because of the capability of sub−micrometer particle trapping and the accessible batch fabrication method, the fiber taper−based trapping systems are highly potential tools that can find many applications in biology and physics.


2009 ◽  
Vol 2009.6 (0) ◽  
pp. 151-152
Author(s):  
Satoshi TERADA ◽  
Akihisa KONNO ◽  
Koichi HIRATA ◽  
Yoichi NIKI ◽  
Masakuni KAWADA

2018 ◽  
Vol 8 (9) ◽  
pp. 1476 ◽  
Author(s):  
Rui-Jun Li ◽  
Peng-Yu Wang ◽  
Dan-Dong Li ◽  
Kuang-Chao Fan ◽  
Fang-Fang Liu ◽  
...  

Patterned leaf springs made of a beryllium bronze sheet are the key components of certain micro/nano contact probes. The accuracy of the probe is determined based on the precision of the formed pattern. However, a traditional manufacturing method using wire-electrode discharge machining (wire-EDM) is subject to poor tolerance at the sharp edges and corners. In addition, high energy consumption and costs are incurred for complex patterns. This paper presents a new chemical etching method for the manufacturing of a patterned leaf spring with high precision. Both the principle and process are introduced. Taguchi experiments were designed and conducted and the optimal process parameters were obtained based on the mean value and a variance analysis. Four V-shaped and some other complex patterned leaf springs were successfully fabricated. Comparison experiments concerning the characteristic parameters of the leaf spring were also conducted. The experimental results reveal that the patterned leaf springs manufactured through this method are much better than those achieved using wire-EDM. This manufacturing method can be used to fabricate different high-precision patterned leaf springs or membranes for coordinate measuring machines (CMM) probes and other measuring equipment.


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