Diffractive lateral-shearing interferometer for phase-shift mask measurement using an excimer laser source

2005 ◽  
Author(s):  
Johannes Schwider ◽  
Gerald Fuetterer ◽  
Norbert Lindlein
2002 ◽  
Author(s):  
Gerald Fuetterer ◽  
M. Lano ◽  
Norbert Lindlein ◽  
Johannes Schwider

1999 ◽  
Vol 558 ◽  
Author(s):  
Chang-Ho Oh ◽  
Mitsuru Nakata ◽  
Masakiyo Matsumura

ABSTRACTWe have proposed a new excimer-laser crystallization system based on an optical projection concept. In the proposed system, a collimated excimer-laser light pulse is irradiated to Si thin-films on a glassy substrate, through a phase-shift mask and an optical lens system. Using oneand two-dimensional phase-shift masks, we have examined feasibility of the proposed method.


1997 ◽  
Vol 36 (Part 1, No. 12B) ◽  
pp. 7488-7493 ◽  
Author(s):  
Keisuke Nakazawa ◽  
Masaya Uematsu ◽  
Toshio Onodera ◽  
Kazuya Kamon ◽  
Tohru Ogawa ◽  
...  

1999 ◽  
Vol 38 (Part 1, No. 5A) ◽  
pp. 2686-2693 ◽  
Author(s):  
Shuji Nakao ◽  
Akihiro Nakae ◽  
Atsumi Yamaguchi ◽  
Kouichirou Tsujita ◽  
Wataru Wakamiya

1999 ◽  
Author(s):  
Nobuhito Toyama ◽  
Hiroyuki Miyashita ◽  
Yasutaka Morikawa ◽  
Hiroshi Fujita ◽  
Kazuya Iwase ◽  
...  

1999 ◽  
Author(s):  
Nobuhiko Fukuhara ◽  
Takashi Haraguchi ◽  
Koichiro Kanayama ◽  
Tadashi Matsuo ◽  
Susumu Takeuchi ◽  
...  

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