Current stress metastability in a-Si:H thin film transistors

2004 ◽  
Author(s):  
Afrin Sultana ◽  
Kapil Sakariya ◽  
Arokia Nathan
Keyword(s):  
Thin Film ◽  
Thin Film Transistors ◽  
Current Stress

scholarly journals Gate voltage and drain current stress instabilities in amorphous In–Ga–Zn–O thin-film transistors with an asymmetric graphene electrode

AIP Advances ◽  
2015 ◽  
Vol 5 (9) ◽  
pp. 097141 ◽  
Author(s):  
Joonwoo Kim ◽  
Sung Myung ◽  
Hee-Yeon Noh ◽  
Soon Moon Jeong ◽  
Jaewook Jeong
Keyword(s):  
Thin Film ◽  
Gate Voltage ◽  
Thin Film Transistors ◽  
Drain Current ◽  
Current Stress ◽  
Graphene Electrode

High current stress effects in amorphous-InGaZnO4 thin-film transistors

2013 ◽  
Vol 102 (2) ◽  
pp. 023503 ◽  
Author(s):  
Mallory Mativenga ◽  
Sejin Hong ◽  
Jin Jang
Keyword(s):  
Thin Film ◽  
Thin Film Transistors ◽  
High Current ◽  
Current Stress ◽  
Stress Effects

Current Stress Induced Electrical Instability in Transparent Zinc Tin Oxide Thin-Film Transistors

2012 ◽  
Vol 12 (4) ◽  
pp. 3421-3424 ◽  
Author(s):  
Woo-Seok Cheong ◽  
Jae-Heon Shin ◽  
Sung Mook Chung ◽  
Chi-Sun Hwang ◽  
Jeong-Min Lee ◽  
...  
Keyword(s):  
Thin Film ◽  
Tin Oxide ◽  
Thin Film Transistors ◽  
Oxide Thin Film ◽  
Current Stress ◽  
Electrical Instability ◽  
Zinc Tin Oxide

Characterization of High-Current Stress-Induced Instability in Amorphous InGaZnO Thin-Film Transistors by Low-Frequency Noise Measurements

2013 ◽  
Vol 34 (11) ◽  
pp. 1403-1405 ◽  
Author(s):  
Andreas Tsormpatzoglou ◽  
Nikolaos A. Hastas ◽  
Forough Mahmoudabadi ◽  
Nackbong Choi ◽  
Miltiadis K. Hatalis ◽  
...  
Keyword(s):  
Thin Film ◽  
Thin Film Transistors ◽  
Low Frequency ◽  
Frequency Noise ◽  
High Current ◽  
Low Frequency Noise ◽  
Current Stress ◽  
Noise Measurements ◽  
Amorphous Ingazno

Investigation on mechanism for instability under drain current stress in amorphous Si–In–Zn–O thin-film transistors

2013 ◽  
Vol 527 ◽  
pp. 314-317 ◽  
Author(s):  
Do Hyung Kim ◽  
Hyun Kwang Jung ◽  
Woochul Yang ◽  
Dae Hwan Kim ◽  
Sang Yeol Lee
Keyword(s):  
Thin Film ◽  
Thin Film Transistors ◽  
Drain Current ◽  
Current Stress ◽  
Amorphous Si
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