Building an infrastructure for parametric yield analysis: concept and implementation of a DFM platform (Invited Paper)

2005 ◽  
Author(s):  
John Gookassian ◽  
Bob Pack ◽  
Mitch Heins ◽  
John Garcia ◽  
Hitendra Divecha ◽  
...  
Keyword(s):  
Yield Analysis ◽  
Parametric Yield ◽  
Analysis Concept

Parametric yield analysis on FEM based microsystem designs

2007 ◽  
Author(s):  
Shyam Praveen Vudathu ◽  
Umamaheswara Reddy Vemulapati ◽  
Duane Boning ◽  
Vasudevarao Ramanolla ◽  
Rainer Laur ◽  
...  
Keyword(s):  
Yield Analysis ◽  
Parametric Yield

Parametric Yield Analysis and Optimization in Leakage Dominated Technologies

2007 ◽  
Vol 15 (6) ◽  
pp. 613-623 ◽  
Author(s):  
K. Agarwal ◽  
R. Rao ◽  
D. Sylvester ◽  
R. Brown
Keyword(s):  
Yield Analysis ◽  
Parametric Yield

Device Selection for Failure Analysis of Chain Fails Using Diagnosis Driven Yield Analysis

2011 ◽  
Author(s):  
Chris Schuermyer ◽  
Brady Benware ◽  
Graham Rhodes ◽  
Davide Appello ◽  
Vincenzo Tancorre ◽  
...  
Keyword(s):  
Failure Analysis ◽  
Case Studies ◽  
Yield Analysis ◽  
Analysis Methodology ◽  
Device Selection ◽  
Selection For ◽  
Random Defects

Abstract This work presents the first application of a diagnosis driven approach for identifying systematic chain fail defects in order to reduce the time spent in failure analysis. The zonal analysis methodology that is applied separates devices into systematic and random populations of chain fails in order to prevent submitting random defects for failure analysis. Two silicon case studies are presented to validate the production worthiness of diagnosis driven yield analysis for chain fails. The defects uncovered in these case studies are very subtle and would be difficult to identify with any other methodology.

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