Optical emission spectroscopy as a process monitor for triod ion plating with TiN
Keyword(s):
2009 ◽
Vol 6
(S1)
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pp. S357-S361
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1985 ◽
Vol 3
(6)
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pp. 2364-2367
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Keyword(s):
Keyword(s):
2003 ◽
Vol 434
(1-2)
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pp. 157-161
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1994 ◽
Vol 12
(1)
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pp. 83-89
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2016 ◽
2018 ◽