Thickness measurement of thin transparent plates with a broadband wavelength-scanning interferometer

2004 ◽  
Author(s):  
Pasquale Maddaloni ◽  
Giuseppe Coppola ◽  
Paolo de Natale ◽  
Sergio de Nicola ◽  
Pietro Ferraro ◽  
...  
Keyword(s):  
Thickness Measurement ◽  
Wavelength Scanning ◽  
Scanning Interferometer

Thickness Measurement of Thin Transparent Plates With a Broad-Band Wavelength Scanning Interferometer

2004 ◽  
Vol 16 (5) ◽  
pp. 1349-1351 ◽  
Author(s):  
P. Maddaloni ◽  
G. Coppola ◽  
P. De Natale ◽  
S. De Nicola ◽  
P. Ferraro ◽  
...  
Keyword(s):  
Broad Band ◽  
Thickness Measurement ◽  
Wavelength Scanning ◽  
Scanning Interferometer

scholarly journals Surface and thickness measurement of a transparent film using wavelength scanning interferometry

2012 ◽  
Vol 20 (19) ◽  
pp. 21450 ◽  
Author(s):  
Feng Gao ◽  
Hussam Muhamedsalih ◽  
Xiangqian Jiang
Keyword(s):  
Thickness Measurement ◽  
Transparent Film ◽  
Wavelength Scanning

Error analysis on the phase calculation from superimposed interferograms generated by a wavelength scanning interferometer

1990 ◽  
Vol 77 (5-6) ◽  
pp. 343-348 ◽  
Author(s):  
Katsuyuki Okada ◽  
Hironobu Sakuta ◽  
Teruji Ose ◽  
Jumpei Tsujiuchi
Keyword(s):  
Error Analysis ◽  
Phase Calculation ◽  
Wavelength Scanning ◽  
Scanning Interferometer

Sinusoidal wavelength-scanning interferometer for profile measurement of metal surfaces

2012 ◽  
Author(s):  
Osami Sasaki ◽  
Takahiro Kurashige ◽  
Samuel Choi ◽  
Takamasa Suzuki
Keyword(s):  
Metal Surfaces ◽  
Profile Measurement ◽  
Wavelength Scanning ◽  
Scanning Interferometer
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