Peel-off probe: a cost-effective probe for electrical atomic force microscopy
2004 ◽
Vol 75
(11)
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pp. 4778-4780
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Keyword(s):
1997 ◽
Vol 222
(1-2)
◽
pp. 69-82
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2020 ◽
2019 ◽
Vol 139
(11)
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pp. 756-759