Wide-scale surface measurement using white light interferometry and atomic force microscopy

1998 ◽  
Author(s):  
Rolf-Juergen Recknagel ◽  
Torsten Feigl ◽  
Angela Duparre ◽  
Gunther Notni
Keyword(s):  
Atomic Force Microscopy ◽  
White Light ◽  
Surface Measurement ◽  
White Light Interferometry ◽  
Force Microscopy ◽  
Atomic Force ◽  
Wide Scale ◽  
Scale Surface

Growth Mechanisms in SAPO-34 Studied by White Light Interferometry and Atomic Force Microscopy

2010 ◽  
Vol 10 (7) ◽  
pp. 2824-2828 ◽  
Author(s):  
Børge Holme ◽  
Pablo Cubillas ◽  
Jasmina Hafizovic Cavka ◽  
Ben Slater ◽  
Michael W. Anderson ◽  
...  
Keyword(s):  
Atomic Force Microscopy ◽  
White Light ◽  
Growth Mechanisms ◽  
White Light Interferometry ◽  
Force Microscopy ◽  
Atomic Force

Discrimination of Adhesion and Viscoelasticity from Nanoscale Maps of Polymer Surfaces using Bimodal Atomic Force Microscopy

Nanoscale ◽  
2021 ◽  
Author(s):  
Bahram Rajabifar ◽  
Anil K Bajaj ◽  
Ronald G. Reifenberger ◽  
Roger Proksch ◽  
Arvind Raman
Keyword(s):  
Atomic Force Microscopy ◽  
Polymer Surfaces ◽  
Surface Imaging ◽  
Force Microscopy ◽  
Simultaneous Excitation ◽  
Atomic Force ◽  
Scale Surface

The simultaneous excitation and measurement of two eigenmodes in bimodal atomic force microscopy (AFM) during sub-micron scale surface imaging augments the number of observables at each pixel of the image...

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