Multidimensional Spectroscopy on the Microscale: Development of a Multimodal Imaging System Incorporating 2D White-Light Spectroscopy, Broadband Transient Absorption, and Atomic Force Microscopy

2019 ◽  
Vol 123 (50) ◽  
pp. 10824-10836 ◽  
Author(s):  
Andrew C. Jones ◽  
Nicholas M. Kearns ◽  
Miriam Bohlmann Kunz ◽  
Jessica T. Flach ◽  
Martin T. Zanni
Keyword(s):  
Atomic Force Microscopy ◽  
White Light ◽  
Multimodal Imaging ◽  
Transient Absorption ◽  
Imaging System ◽  
Force Microscopy ◽  
Multidimensional Spectroscopy ◽  
Atomic Force

Growth Mechanisms in SAPO-34 Studied by White Light Interferometry and Atomic Force Microscopy

2010 ◽  
Vol 10 (7) ◽  
pp. 2824-2828 ◽  
Author(s):  
Børge Holme ◽  
Pablo Cubillas ◽  
Jasmina Hafizovic Cavka ◽  
Ben Slater ◽  
Michael W. Anderson ◽  
...  
Keyword(s):  
Atomic Force Microscopy ◽  
White Light ◽  
Growth Mechanisms ◽  
White Light Interferometry ◽  
Force Microscopy ◽  
Atomic Force

scholarly journals In situ characterization of nanoscale contaminations adsorbed in air using atomic force microscopy

2018 ◽  
Vol 9 ◽  
pp. 2925-2935 ◽  
Author(s):  
Jesús S Lacasa ◽  
Lisa Almonte ◽  
Jaime Colchero
Keyword(s):  
Atomic Force Microscopy ◽  
Ambient Conditions ◽  
Contact Potential ◽  
Force Microscopy ◽  
Multidimensional Spectroscopy ◽  
Atomic Force ◽  
Microscopy Techniques ◽  
Sample System

Under ambient conditions, surfaces are rapidly modified and contaminated by absorbance of molecules and a variety of nanoparticles that drastically change their chemical and physical properties. The atomic force microscope tip–sample system can be considered a model system for investigating a variety of nanoscale phenomena. In the present work we use atomic force microscopy to directly image nanoscale contamination on surfaces, and to characterize this contamination by using multidimensional spectroscopy techniques. By acquisition of spectroscopy data as a function of tip–sample voltage and tip–sample distance, we are able to determine the contact potential, the Hamaker constant and the effective thickness of the dielectric layer within the tip–sample system. All these properties depend strongly on the contamination within the tip–sample system. We propose to access the state of contamination of real surfaces under ambient conditions using advanced atomic force microscopy techniques.

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