Growth Mechanisms in SAPO-34 Studied by White Light Interferometry and Atomic Force Microscopy

Børge Holme; Pablo Cubillas; Jasmina Hafizovic Cavka; Ben Slater; Michael W. Anderson; Duncan Akporiaye

doi:10.1021/cg9016118

Growth Mechanisms in SAPO-34 Studied by White Light Interferometry and Atomic Force Microscopy

Crystal Growth & Design ◽

10.1021/cg9016118 ◽

2010 ◽

Vol 10 (7) ◽

pp. 2824-2828 ◽

Cited By ~ 15

Author(s):

Børge Holme ◽

Pablo Cubillas ◽

Jasmina Hafizovic Cavka ◽

Ben Slater ◽

Michael W. Anderson ◽

...

Keyword(s):

Atomic Force Microscopy ◽

White Light ◽

Growth Mechanisms ◽

White Light Interferometry ◽

Force Microscopy ◽

Atomic Force

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Wide-scale surface measurement using white light interferometry and atomic force microscopy

10.1117/12.316465 ◽

1998 ◽

Cited By ~ 2

Author(s):

Rolf-Juergen Recknagel ◽

Torsten Feigl ◽

Angela Duparre ◽

Gunther Notni

Keyword(s):

Atomic Force Microscopy ◽

White Light ◽

Surface Measurement ◽

White Light Interferometry ◽

Force Microscopy ◽

Atomic Force ◽

Wide Scale ◽

Scale Surface

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3D visualization of mold filling stages in thermal nanoimprint by white light interferometry and atomic force microscopy

Nanotechnology ◽

10.1088/0957-4484/20/35/355301 ◽

2009 ◽

Vol 20 (35) ◽

pp. 355301 ◽

Cited By ~ 11

Author(s):

Helmut Schift ◽

Geehong Kim ◽

Jaejong Lee ◽

Jens Gobrecht

Keyword(s):

Atomic Force Microscopy ◽

White Light ◽

3D Visualization ◽

Mold Filling ◽

White Light Interferometry ◽

Force Microscopy ◽

Atomic Force

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Multi-scale analysis of high precision surfaces by Stylus Profiler, Scanning White-Light Interferometry and Atomic Force Microscopy

International Journal of Surface Science and Engineering ◽

10.1504/ijsurfse.2009.027418 ◽

2009 ◽

Vol 3 (4) ◽

pp. 310 ◽

Cited By ~ 11

Author(s):

N. Jouini ◽

A. Gautier ◽

P. Revel ◽

P E. Mazeran ◽

M. Bigerelle

Keyword(s):

Atomic Force Microscopy ◽

White Light ◽

Scale Analysis ◽

White Light Interferometry ◽

Force Microscopy ◽

Multi Scale ◽

Atomic Force ◽

Scanning White Light Interferometry ◽

Multi Scale Analysis ◽

Stylus Profiler

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Ex situ atomic force microscopy studies of growth mechanisms of cadmium mercury thiocyanate crystals

Journal of Crystal Growth ◽

10.1016/s0022-0248(01)01733-x ◽

2002 ◽

Vol 234 (2-3) ◽

pp. 480-486 ◽

Cited By ~ 8

Author(s):

X.N. Jiang ◽

D. Xu ◽

D.L. Sun ◽

D.R. Yuan ◽

M.K. Lu ◽

...

Keyword(s):

Atomic Force Microscopy ◽

Ex Situ ◽

Growth Mechanisms ◽

Force Microscopy ◽

Atomic Force

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A Potentiostatic and Atomic Force Microscopy Study of the Nucleation and Growth Mechanisms of Certain Metallic Cyanometalates

The Journal of Physical Chemistry C ◽

10.1021/jp0716942 ◽

2007 ◽

Vol 111 (47) ◽

pp. 17541-17550 ◽

Cited By ~ 2

Author(s):

M. Orellana ◽

R. Del Río ◽

R. Schrebler ◽

R. Cordova

Keyword(s):

Atomic Force Microscopy ◽

Microscopy Study ◽

Nucleation And Growth ◽

Growth Mechanisms ◽

Atomic Force Microscopy Study ◽

Force Microscopy ◽

Atomic Force ◽

Nucleation And Growth Mechanisms

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Improved zero-order fringe positioning algorithms in white light interference based atomic force microscopy

Optics and Lasers in Engineering ◽

10.1016/j.optlaseng.2017.07.010 ◽

2018 ◽

Vol 100 ◽

pp. 71-76 ◽

Cited By ~ 14

Author(s):

Chi Hu ◽

Xiaojun Liu ◽

Wenjun Yang ◽

Wenlong Lu ◽

Nengguo Yu ◽

...

Keyword(s):

Atomic Force Microscopy ◽

White Light ◽

Zero Order ◽

Force Microscopy ◽

Light Interference ◽

Atomic Force ◽

White Light Interference

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Atomic structures and growth mechanisms of electrodeposited Ag and Te films as discerned by atomic force microscopy

Journal of Vacuum Science & Technology B Microelectronics Processing and Phenomena ◽

10.1116/1.589100 ◽

1996 ◽

Vol 14 (2) ◽

pp. 1369 ◽

Cited By ~ 9

Author(s):

Norihito Ikemiya

Keyword(s):

Atomic Force Microscopy ◽

Growth Mechanisms ◽

Force Microscopy ◽

Atomic Structures ◽

Atomic Force

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Atomic force microscopy study of the growth mechanisms of nanostructured sputtered Au film on Si(111): Evolution with film thickness and annealing time

Journal of Applied Physics ◽

10.1063/1.3428467 ◽

2010 ◽

Vol 107 (10) ◽

pp. 104321 ◽

Cited By ~ 58

Author(s):

F. Ruffino ◽

M. G. Grimaldi

Keyword(s):

Atomic Force Microscopy ◽

Film Thickness ◽

Annealing Time ◽

Microscopy Study ◽

Growth Mechanisms ◽

Atomic Force Microscopy Study ◽

Force Microscopy ◽

Au Film ◽

Atomic Force

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In situ atomic force microscopy studies of growth mechanisms and surface morphology of zinc thiourea sulfate crystals

Crystal Research and Technology ◽

10.1002/crat.201400482 ◽

2015 ◽

Vol 50 (11) ◽

pp. 828-839 ◽

Cited By ~ 1

Author(s):

Jie Song ◽

Mingwei Li ◽

Yachao Cao ◽

Huawei Yin

Keyword(s):

Atomic Force Microscopy ◽

Surface Morphology ◽

Growth Mechanisms ◽

Force Microscopy ◽

Atomic Force

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Investigation of growth mechanisms of TSS-grown KLu(WO4)2 crystals by atomic force microscopy

Optical Materials ◽

10.1016/j.optmat.2005.08.043 ◽

2006 ◽

Vol 29 (4) ◽

pp. 421-424 ◽

Cited By ~ 5

Author(s):

Kunpeng Wang ◽

Jianxiu Zhang ◽

Jiyang Wang ◽

Wentao Yu ◽

Huaijin Zhang ◽

...

Keyword(s):

Atomic Force Microscopy ◽

Growth Mechanisms ◽

Force Microscopy ◽

Atomic Force

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