Effect of the concentration of impurities, determining the space charge region thickness on detection properties of Cr/CdTe/Au Schottky diode detectors
2005 ◽
Vol 2
(6)
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pp. 1917-1923
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Keyword(s):
2011 ◽
Vol 8
(4)
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pp. 1273-1277
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1999 ◽
Vol 273-274
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pp. 395-397
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2016 ◽
Vol 4
(19)
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pp. 7437-7444
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2000 ◽
Vol 46
(4)
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pp. 563-569
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