Influence of a space charge region on charge carrier kinetics in silicon wafers

2002 ◽  
Vol 91 (11) ◽  
pp. 9147-9150 ◽  
Author(s):  
S. von Aichberger ◽  
O. Abdallah ◽  
F. Wünsch ◽  
M. Kunst
2001 ◽  
Vol 664 ◽  
Author(s):  
Susanne von Aichberger ◽  
Frank Wünsch ◽  
Marinus Kunst

ABSTRACTContactless transient photoconductivity measurements of a-Si:H / c-Si heterojunctions are presented. It is shown that n a-Si:H / n c-Si junctions furnish an excellent passivation of the n c-Si surface. For i a-Si:H / n c-Si junctions the passivation is better for thicker films, whereas for very thin films (10 nm or less) a deviating behaviour probably due to inhomogeneities is observed. For the p a-Si:H / n c-Si junction separation of excess charge carriers in the space charge region is observed leading to a slowly decaying tail of the signal. This separation is also observed in thick i a-Si:H / n c-Si samples where electrons are injected from the a-Si:H film in the c-Si substrate.


2015 ◽  
Vol 22 ◽  
pp. 29-34 ◽  
Author(s):  
Patric Büchele ◽  
Mauro Morana ◽  
Diego Bagnis ◽  
Sandro Francesco Tedde ◽  
David Hartmann ◽  
...  

2016 ◽  
Vol 4 (19) ◽  
pp. 7437-7444 ◽  
Author(s):  
Jonathan M. Polfus ◽  
Tor S. Bjørheim ◽  
Truls Norby ◽  
Rune Bredesen

First-principles calculations were utilized to elucidate the complete defect equilibria of surfaces of proton conducting BaZrO3, encompassing charged species adsorbed to the surface, defects in the surface layer as well as in the subsurface space-charge region and bulk.


Sign in / Sign up

Export Citation Format

Share Document