Beam size measurement for XFEL nanobeam using intensity interferometer of x-ray fluorescence (Conference Presentation)

2019 ◽  
Author(s):  
Nami Nakamura ◽  
Satoshi Matsuyama ◽  
Takato Inoue ◽  
Ichiro Inoue ◽  
Taito Osaka ◽  
...  
Keyword(s):  
Beam Size ◽  
Size Measurement ◽  
X Ray ◽  
Intensity Interferometer

Arsenic segregation in polysilicon

1983 ◽  
Vol 41 ◽  
pp. 154-155 ◽  
Author(s):  
P.E. Batson ◽  
C.R.M. Grovenor ◽  
D.A. Smith ◽  
C. Wong
Keyword(s):  
Incident Beam ◽  
Silicon Wafers ◽  
Chemical Polishing ◽  
Bright Field Image ◽  
Beam Size ◽  
Stem Analysis ◽  
Bright Field ◽  
Twin Boundaries ◽  
X Ray ◽  
Line Scan

In this work As doped polysilicon was deposited onto (100) silicon wafers by APCVD at 660°C from a silane-arsine mixture, followed by a ten minute anneal at 1000°C, and in one case a further ten minute anneal at 700°C. Specimens for TEM and STEM analysis were prepared by chemical polishing. The microstructure, which is unchanged by the final 700°C anneal,is shown in Figure 1. It consists of numerous randomly oriented grains many of which contain twins.X-ray analysis was carried out in a VG HB5 STEM. As K α x-ray counts were collected from STEM scans across grain and twin boundaries, Figures 2-4. The incident beam size was about 1.5nm in diameter, and each of the 20 channels in the plots was sampled from a 1.6nm length of the approximately 30nm line scan across the boundary. The bright field image profile along the scanned line was monitored during the analysis to allow correlation between the image and the x-ray signal.

Analytical account for off-axis effects in X-ray radiation of free electron lasers

2021 ◽  
Vol 64 (1) ◽  
pp. 21-28
Author(s):  
K.V. Zhukovsky ◽  
Keyword(s):  
Free Electron ◽  
Finite Size ◽  
Photon Radiation ◽  
Beam Parameter ◽  
Beam Size ◽  
Free Electron Lasers ◽  
Airy Functions ◽  
X Ray ◽  
Harmonic Radiation ◽  
Gain Length

We give analytical description of generation of harmonics of the undulator radiation (UR) with account for the finite electron beam size, emittance, off-axis beam deviation and electron energy spread, as well as for the constant magnetic components and field harmonics effects. We give exact analytical expressions for the generalized Bessel and Airy functions, which describe the spectrum line shape and intensities in the two-frequency bi-harmonic undulator with account for the above factors. The obtained analytical formulae distinguish contributions of each field component and every undulator and beam parameter on the harmonic radiation in free electron lasers (FEL). The effect of the field on the harmonic radiation is analyzed with account for the beam finite size and its off-axis deviation. The phenomenological model is employed for the FEL modeling; with its help we study the harmonic generation, including even ones, in the experiments LCLS and LEUTL. We demonstrate analytically that strong second FEL harmonic in X-ray FEL at the wavelengths λ = 0.75nm in the LCLS experiment is caused by the deviation of the electron trajectories off the axis in 15 μm on the gain length 1.6 m, which is comparable with the beam size; the strong second FEL harmonic in the LEUTL experiment at the wavelength λ = 192nm can be attributed to interaction of the electrons in wide, ~ 0.2 mm, beam with the photon radiation at the gain length 0.87 m. The modeling results fully agree with the measurements. The developed formalism allows the analysis of projected and built FELs and their radiation, helps minimizing losses and correcting magnetic fields; it also shows physical background and reasons for each harmonic radiated power in the FEL.

scholarly journals Beam size measurement of the stored electron beam at the APS storage ring using zone plate optics and undulator radiation

1997 ◽  
Author(s):  
Zhonghou Cai ◽  
Barry Lai ◽  
Wenbing Yun ◽  
Efim Gluskin ◽  
Dan Legnini ◽  
...  
Keyword(s):  
Electron Beam ◽  
Storage Ring ◽  
Zone Plate ◽  
Beam Size ◽  
Size Measurement ◽  
Undulator Radiation

First measurements of the vertical beam size with an X-ray beam size monitor in SuperKEKB rings

2019 ◽  
Vol 919 ◽  
pp. 1-15
Author(s):  
Emy Mulyani ◽  
John W. Flanagan ◽  
Makoto Tobiyama ◽  
Hitoshi Fukuma ◽  
Hitomi Ikeda ◽  
...  
Keyword(s):  
Beam Size ◽  
X Ray ◽  
Vertical Beam

A Scanning X-Ray Fluorescence Microprobe with Synchrotron Radiation

1987 ◽  
Vol 31 ◽  
pp. 495-502 ◽  
Author(s):  
Y. Gohshj ◽  
S. Aoki ◽  
A. Iida ◽  
S. Hayakawa ◽  
H. Yamaji ◽  
...  
Keyword(s):  
Synchrotron Radiation ◽  
Relative Concentration ◽  
Trace Element Analysis ◽  
Design Parameters ◽  
Absolute Amount ◽  
Beam Size ◽  
Element Analysis ◽  
X Ray ◽  
Better Than

SummaryA scantling X-ray fluorescence(XRF) microprobe using WoIter type 1 optics was developed, and micro and trace element analysis was carried out using synchrotron radiation up to 10 keV as an excitation source. The design parameters of the optical system and the performance of the system, such as the beam size and the intensity, are described. The MDL obtained for Mn was 6 ppm in relative concentration and about 0.1 pg in absolute amount. The estimated spatial resolution was better than 10 um.

Synchrotron X-ray Microbeam Characteristics for X-ray Fluorescence Analysis

1994 ◽  
Vol 38 ◽  
pp. 283-289
Author(s):  
A. Iida ◽  
T. Noma
Keyword(s):  
Detection Limit ◽  
Spectroscopic Analysis ◽  
Fluorescence Analysis ◽  
Photon Flux ◽  
Beam Size ◽  
X Ray ◽  
Available Energy ◽  
Practical Analysis ◽  
Micro Analysis ◽  
Non Destructive

X-ray fluorescence analysis using a synchrotron x-ray microprobe has become an indispensable technique for non-destructive micro-analysis. One of the most important parameters that characterize the x-ray microbeam system for x-ray fluorescence analysis is the beam size. For practical analysis, however, the photon flux, the energy resolution and the available energy range are also crucial. Three types of x-ray microbeam systems, including monochromatic and continuum excitation systems, were compared with reference to the sensitivity, the minimum detection limit and the applicability to various types of x-ray spectroscopic analysis.

Electron Microprobe Analyses and X-Ray Diffraction Study of SrSi2

1966 ◽  
Vol 10 ◽  
pp. 409-421
Author(s):  
G. M. Faulring ◽  
E. S. Malizie
Keyword(s):  
Electron Microprobe ◽  
Polarized Light ◽  
Surface Preparation ◽  
Unit Cell ◽  
Intensity Data ◽  
Beam Size ◽  
Chemical Analyses ◽  
X Ray Diffraction ◽  
X Ray ◽  
Probable Space

AbstractAlthough the phase SrSi2 has been previously recognized, it has been described only briefly in the literature.An alloy comprised of FeSi2, silicon, and the SrSi2 phase was examined on the electron microprobe. Optical and electron scanning images are correlated with X-ray scanning images for iron, silicon, calcium, and strontium. Quantitative microprobe analyses were made and corrected for absorption and the atomic number effect by several noncomputer methods. The corrections include as variables the X-ray intensities measured at several accelerating voltages. The effects of varying the electron beam size and accelerating potential are included. The results are compared to chemical analyses. The advantages of varying the accelerating voltage when correcting intensity data, increasing the beam size when surface preparation is a factor, and the importance of surface preparation at low accelerating voltages are discussed.An X-ray diffraction examination showed that the phase SrSi2 has a cubic unit cell with an a0 of 6.515 Å. There are four molecules per unit cell, and the most probable space group appears to be P213. The density was calculated as 3.45 (observed density >3.3).Metallographic observations with ordinary and polarized light and microhardness measurements are included.

Comparing Elemental Sensitivities Obtained With an Aperture and a Monolithic Polycapillary Optic Using a Commercial Micro-X-Ray Fluorescence (MXRF) Instrument

1998 ◽  
Vol 4 (S2) ◽  
pp. 380-381
Author(s):  
C. G. Worley ◽  
L. P. Colletti ◽  
G. J. Havrilla
Keyword(s):  
Focal Spot ◽  
Total Reflection ◽  
Standard Reference Materials ◽  
Optical Systems ◽  
Beam Size ◽  
X Ray ◽  
Elemental Concentrations ◽  
Trace Elemental ◽  
Focal Spot Diameter ◽  
Capillary Optic

Recent MXRF reports have demonstrated marked x-ray flux enhancements over traditional aperturecollimating systems when using a total reflection capillary optic. In the present work, several standard reference materials (SRMs) were examined with a Kevex Omicron MXRF system to compare the elemental sensitivities achieved with an aperture x-ray guide to those obtained with a monolithic polycapillary optic (X-ray Optical Systems). This study is relevant to the MXRF community using commercial aperture-based instruments where trace elemental concentrations in a sample sometimes mandate the need for a higher primary x-ray dose, but the flexibility of incorporating various sized apertures for other samples is still maintained.By scanning the x-ray beam over a nickel/gold knife edge, the capillary focal spot diameter at the time of this work was determined to be ∼400 μm, while a 300 μm aperture provided a beam size of ∼550 μm due to beam divergence past the aperture.

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