Testing low-temperature atomic layer deposition of aluminum oxide in a 36” chamber

Author(s):  
David Fryauf ◽  
Andrew C. Phillips ◽  
Nobuhiko Kobayashi ◽  
Michael J. Bolte ◽  
Aaron Feldman ◽  
...  
2007 ◽  
Vol 90 (3) ◽  
pp. 033104 ◽  
Author(s):  
Ching-Jung Yang ◽  
Shun-Min Wang ◽  
Shih-Wei Liang ◽  
Yung-Huang Chang ◽  
Chih Chen ◽  
...  

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