Progress in the indirect slumping technology development at MPE for lightweight x-ray optics

2016 ◽  
Author(s):  
Mingwu Wen ◽  
Laura Proserpio ◽  
Elias Breunig ◽  
Peter Friedrich ◽  
Vadim Burwitz ◽  
...  
Keyword(s):  
Technology Development ◽  
Ray Optics ◽  
X Ray

Technology development for high-energy x-ray optics

2006 ◽  
Author(s):  
Mikhail Gubarev ◽  
Brian Ramsey ◽  
Darell Engelhaupt ◽  
Thomas Kester ◽  
Chet Speegle
Keyword(s):  
Technology Development ◽  
High Energy ◽  
Ray Optics ◽  
X Ray

Technology development of adjustable grazing incidence x-ray optics for sub-arc second imaging

2012 ◽  
Author(s):  
P. B. Reid ◽  
T. L. Aldcroft ◽  
V. Cotroneo ◽  
W. Davis ◽  
R. L. Johnson-Wilke ◽  
...  
Keyword(s):  
Technology Development ◽  
Grazing Incidence ◽  
Ray Optics ◽  
X Ray

Technology development for nickel x-ray optics enhancement

2008 ◽  
Author(s):  
Mikhail Gubarev ◽  
Brian Ramsey ◽  
Darell Engelhaupt ◽  
William Arnold
Keyword(s):  
Technology Development ◽  
Ray Optics ◽  
X Ray

Generation-X mirror technology development plan and the development of adjustable x-ray optics

2009 ◽  
Author(s):  
Paul B. Reid ◽  
William Davis ◽  
Stephen O'Dell ◽  
Daniel A. Schwartz ◽  
Susan Tolier-McKinstry ◽  
...  
Keyword(s):  
Generation X ◽  
Technology Development ◽  
Development Plan ◽  
Ray Optics ◽  
X Ray

X-ray microprobe for materials science

1994 ◽  
Vol 52 ◽  
pp. 56-57
Author(s):  
G.E. Ice
Keyword(s):  
Crystallographic Orientation ◽  
Local Structure ◽  
Materials Science ◽  
Chemical Information ◽  
X Ray Diffraction ◽  
Ray Optics ◽  
X Ray ◽  
Novel Materials ◽  
New Information ◽  
Elemental Sensitivity

The increasing availability of synchrotron x-ray sources has stimulated the development of advanced hard x-ray (E≥5 keV) microprobes. With new x-ray optics these microprobes can achieve micron and submicron spatial resolutions. The inherent elemental and crystallographic sensitivity of an x-ray microprobe and its inherently nondestructive and penetrating nature will have important applications to materials science. For example, x-ray fluorescent microanalysis of materials can reveal elemental distributions with greater sensitivity than alternative nondestructive probes. In materials, segregation and nonuniform distributions are the rule rather than the exception. Common interfaces to whichsegregation occurs are surfaces, grain and precipitate boundaries, dislocations, and surfaces formed by defects such as vacancy and interstitial configurations. In addition to chemical information, an x-ray diffraction microprobe can reveal the local structure of a material by detecting its phase, crystallographic orientation and strain.Demonstration experiments have already exploited the penetrating nature of an x-ray microprobe and its inherent elemental sensitivity to provide new information about elemental distributions in novel materials.

Aperiodic multilayer structures in soft X-ray optics

2015 ◽  
Vol 185 (11) ◽  
pp. 1203-1214 ◽  
Author(s):  
Aleksandr S. Pirozhkov ◽  
Evgenii N. Ragozin
Keyword(s):  
Multilayer Structures ◽  
Ray Optics ◽  
X Ray

Diffraction limited X-ray optics: technology, metrology, applications

2019 ◽  
Vol 190 (01) ◽  
pp. 74-91
Author(s):  
Nikolai I. Chkhalo ◽  
Ilya V. Malyshev ◽  
Alexey E. Pestov ◽  
Vladimir N. Polkovnikov ◽  
Nikolai N. Salashchenko ◽  
...  
Keyword(s):  
Ray Optics ◽  
X Ray
Sign in / Sign up

Export Citation Format

Share Document