Generation-X mirror technology development plan and the development of adjustable x-ray optics

Author(s):  
Paul B. Reid ◽  
William Davis ◽  
Stephen O'Dell ◽  
Daniel A. Schwartz ◽  
Susan Tolier-McKinstry ◽  
...  
2006 ◽  
Author(s):  
Mikhail Gubarev ◽  
Brian Ramsey ◽  
Darell Engelhaupt ◽  
Thomas Kester ◽  
Chet Speegle

2006 ◽  
Author(s):  
Martin Elvis ◽  
R. J. Brissenden ◽  
G. Fabbiano ◽  
D. A. Schwartz ◽  
P. Reid ◽  
...  

2012 ◽  
Author(s):  
P. B. Reid ◽  
T. L. Aldcroft ◽  
V. Cotroneo ◽  
W. Davis ◽  
R. L. Johnson-Wilke ◽  
...  

2016 ◽  
Author(s):  
Mingwu Wen ◽  
Laura Proserpio ◽  
Elias Breunig ◽  
Peter Friedrich ◽  
Vadim Burwitz ◽  
...  

2005 ◽  
Vol 61 (a1) ◽  
pp. c20-c20
Author(s):  
M. Yabashi ◽  
K. Tamasaku ◽  
Y. Tanaka ◽  
T. Hara ◽  
T. Tanaka ◽  
...  

Author(s):  
Brian R. York

We have built a third generation X-Ray Micro-Diffractometer (XRMD) which is capable of examining the structure of single grains as small as 3 microns by utilizing, in part, cylindrical or conical glass capillaries as x-ray focusing optics. The idea of using capillaries as total reflection focusing optics for x-ray diffraction is not new. However, these capillaries were usually of poor quality with inner diameters nominally larger than 10 microns, and due to the general unavailability of scanning XRMDs, and high brilliancy sources, they were used primarily with back reflection cameras. Cylindrical precision bore capillaries with thick internal walls, smooth enough to be suitable for use as total reflection x-ray focusing elements, are now commercially available in long sections with inner diameters as small as 10 microns. A methodology was established to fabricate, in-house, conical capillaries with inner diameters less than 3 microns and various taper geometries. Using such focusing elements the gain in the diffracted intensity, over that achievable using a simple aperture approach, could be varied up to 4X and 30X for cylindrical and conical capillaries respectively, by varying the capillary geometry, and are discussed below.


Author(s):  
Barbara A. Thomson ◽  
Norman J. Armendariz

Abstract A new generation X-ray laminography (XRL) automated Xray inspection (AXI) tool was evaluated for surface mount technology (SMT) assembly defect detection and was qualified using formal “benchmark” comparative analysis processes. In addition, defect characterization was performed using the XRL AXI system in manual X-ray inspection mode to correlate various failure modes and mechanisms at SMT solder joint interfaces for selected non-destructive failure analyses and technology development. Since ball grid array (BGA) solder joint quality is a great concern in board assembly, test technology development and failure analysis teams explored the use of XRL AXI as a method to detect and monitor BGA ball abnormalities using XRL AXI-generated solder ball images and measurements. It was found that XRL AXI was able to successfully discern differences in the shape, location and diameter of the suspect BGA solder balls from XRL AXI horizontal image planes (slices) for physical failure analysis and reliability issues not previously detected using conventional X-ray transmission or electrical methods. Subsequent metallographic x-sectioning correlated the XRL AXI mages to the physical condition of the suspected second level interconnect (SLI) solder joint location.


2008 ◽  
Author(s):  
Mikhail Gubarev ◽  
Brian Ramsey ◽  
Darell Engelhaupt ◽  
William Arnold

Author(s):  
Michael Biskach ◽  
Timo Saha ◽  
William Zhang ◽  
James Mazzarella ◽  
Ryan McClelland ◽  
...  

Next generation X-ray telescopes in the coming decades require optics with high angular resolution and large collecting area at a fixed cost and budget. X-ray optics, unlike traditional normal incidence optics in optical and infrared telescopes, require many times the polished surface area to obtain an equivalent collecting area due to the nature of glancing incidence optics necessary to reflect higher energy X-ray photons. The Next Generation X-ray Optics (NGXO) group at NASA Goddard Space Flight Center (GSFC) is developing a manufacturing process capable of producing sub 5 arc-second half-power diameter (HPD) angular resolution optics in the near term, with the long term goal of producing optics for an X-ray telescope in the next 10 years with sub 1 arc-second HPD angular resolution. By parallelizing the production, integration, and testing of X-ray mirrors in separate modules, thousands of precisely formed X-ray mirror segments are assembled into one Mirror Assembly (MA), lowering the cost per collecting area by orders of magnitude compared to previous X-ray telescopes with similar resolution like the Chandra X-ray Observatory. Novel uses of kinematic mounts, precision actuators, and epoxy fixes each X-ray mirror segment to the submicron level with the sufficient strength to survive rocket launch.


2018 ◽  
Vol 24 (S2) ◽  
pp. 304-305
Author(s):  
Wenbing Yun ◽  
Mark Cordier ◽  
Benjamin Stripe ◽  
Sylvia Lewis ◽  
Janos Kirz

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