Fiber-optic based in situ atomic spectroscopy for manufacturing of x-ray optics

2016 ◽  
Author(s):  
George Atanasoff ◽  
Christopher J. Metting ◽  
Hasso von Bredow
Keyword(s):  
Fiber Optic ◽  
Atomic Spectroscopy ◽  
Ray Optics ◽  
X Ray

An intensity modulated fiber-optic carbon monoxide sensor based on Ag/Co-MOF in-situ coated thin-core fiber

2021 ◽  
Vol 0 (0) ◽  
Author(s):  
Lian Wang ◽  
Juncheng Zhou ◽  
Yuhao Chen ◽  
Liu Xiao ◽  
Guojia Huang ◽  
...  
Keyword(s):  
Electron Microscopy ◽  
Carbon Monoxide ◽  
Photoelectron Spectroscopy ◽  
Fiber Optic ◽  
Temperature Stability ◽  
Single Mode ◽  
X Ray ◽  
Intensity Modulated ◽  
Core Fiber

Abstract An intensity modulated fiber-optic carbon monoxide (CO) sensor by integrating in-situ solvothermal-growth Ag/Co-MOF sensing film is fabricated and evaluated. The Michelson interference sensing structure is composed of single-mode fiber (SMF), enlarged taper, thin-core fiber (TCF), and Ag film as the reflector. Ag/Co-MOF was coated on the cladding of the TCF as the sensing material, and the enlarged taper is located between TCF and SMF as the coupler. The structure, morphology, compositions and thermal stability of the Ag/Co-MOF sensing film were characterized by X-ray diffraction (XRD), scanning electron microscopy (SEM), transmission electron microscopy (TEM), X-ray photoelectron spectroscopy (XPS), thermogravimetric analysis (TGA), etc. The sensitivity of the sensor is 0.04515 dB/ppm, and the fitting parameter of the CO concentration is 0.99876. In addition, the sensor has the advantages of good selectivity, good signal and temperature stability, and it has potential application in trace CO detection.

X-ray optics of in-situ synchrotron topography studies of the early stages of relaxation in epitaxial InGaAs on GaAs

1998 ◽  
Author(s):  
Brian K. Tanner ◽  
Andrew M. Keir ◽  
Peter Moeck ◽  
Colin R. Whitehouse ◽  
Gareth Lacey ◽  
...  
Keyword(s):  
Ray Optics ◽  
X Ray ◽  
Early Stages

In-situ metrology for adaptive x-ray optics with an in-position LTP system in the soft x-ray beamline

2020 ◽  
Author(s):  
Shang-Wei Lin ◽  
Duan-Jen Wang ◽  
Chih-Yu Hua ◽  
Hok-Sum Fung ◽  
Ming-Ying Hsu ◽  
...  
Keyword(s):  
Ray Optics ◽  
X Ray ◽  
In Situ Metrology

Doubly curved crystal (DCC) X-ray optics and applications

2002 ◽  
Vol 17 (2) ◽  
pp. 99-103 ◽  
Author(s):  
Zewu Chen ◽  
Walter M. Gibson
Keyword(s):  
Thin Films ◽  
Low Power ◽  
X Rays ◽  
Enabling Technology ◽  
Ray Optics ◽  
X Ray ◽  
Composition And Structure ◽  
Composition Structure ◽  
Doubly Curved

Doubly curved crystal (DCC) X-ray optics provide an enabling technology for new portable, remote, and in situ applications of monochromatic X-rays for composition and structure analysis of amorphous, polycrystalline, and crystalline solids. Femtogram sensitivity for surface contamination, parts-per-billion (ppb) impurity levels for solids, and composition, structure and uniformity of thin films with compact, low power (20–50 W) source optic combinations are possible.

The Use of Advanced Analytical Techniques for Characterization of the Chemical, Physical, and Crystallographic Nature of a Surface

1973 ◽  
Vol 31 ◽  
pp. 132-133 ◽  
Author(s):  
R. E. Herfert
Keyword(s):  
Surface Characterization ◽  
Analytical Techniques ◽  
X Ray Diffraction ◽  
Depth Of Penetration ◽  
X Ray ◽  
The Past ◽  
Transmission Electron ◽  
Scanning Electron

Studies of the nature of a surface, either metallic or nonmetallic, in the past, have been limited to the instrumentation available for these measurements. In the past, optical microscopy, replica transmission electron microscopy, electron or X-ray diffraction and optical or X-ray spectroscopy have provided the means of surface characterization. Actually, some of these techniques are not purely surface; the depth of penetration may be a few thousands of an inch. Within the last five years, instrumentation has been made available which now makes it practical for use to study the outer few 100A of layers and characterize it completely from a chemical, physical, and crystallographic standpoint. The scanning electron microscope (SEM) provides a means of viewing the surface of a material in situ to magnifications as high as 250,000X.

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