Doubly curved crystal (DCC) X-ray optics and applications

2002 ◽  
Vol 17 (2) ◽  
pp. 99-103 ◽  
Author(s):  
Zewu Chen ◽  
Walter M. Gibson
Keyword(s):  
Thin Films ◽  
Low Power ◽  
X Rays ◽  
Enabling Technology ◽  
Ray Optics ◽  
X Ray ◽  
Composition And Structure ◽  
Composition Structure ◽  
Doubly Curved

Doubly curved crystal (DCC) X-ray optics provide an enabling technology for new portable, remote, and in situ applications of monochromatic X-rays for composition and structure analysis of amorphous, polycrystalline, and crystalline solids. Femtogram sensitivity for surface contamination, parts-per-billion (ppb) impurity levels for solids, and composition, structure and uniformity of thin films with compact, low power (20–50 W) source optic combinations are possible.

In Situ Growth of PbZrxTi1-xO3 Thin Films by Pulsed Laser Deposition

1990 ◽  
Vol 191 ◽  
Author(s):  
D. B. Chrisey ◽  
J. S. Horwitz ◽  
K. S. Grabowski
Keyword(s):  
Thin Films ◽  
Substrate Temperature ◽  
Laser Deposition ◽  
X Ray Diffraction ◽  
X Ray ◽  
Composition And Structure ◽  
Elastic Backscattering ◽  
Deposited Film ◽  
Deposited Films

ABSTRACTWe have investigated the composition and structure of thin films of PbZrxTi1-xO3 (x-0.54) produced in situ by pulsed excimer laser deposition from a stoichiometric pressed oxide target. Thin films were deposited onto (100) MgO and SrTiO3 substrates as a function of substrate temperature between room temperature and 750 °C, and oxygen background pressures between vacuum and 300 mtorr. The deposited films were very smooth with particulates covering less than 0.5% of the surface. Elastic backscattering spectroscopy was used to determine the relative atomic fractions. In the deposited films, the Pb stoichiometry was found to be very sensitive to both the substrate temperature and the O2 background pressure. Above ∼600 °C, the Pb content dropped rapidly with increasing substrate temperature for a 50 mtorr 02 background. At 550 °C the Pb content was near-stoichiometric for O2 background pressures between 200 and 300 mtorr but dropped monotonically to ∼20% of the expected value for depositions in a vacuum (i.e., no O2 background). Over this entire range of pressures and temperatures the Ti/Zr stoichiometry ratio was relatively uneffected. The structure and orientation of the deposited films, as determined by x-ray diffraction, followed the Pb deficiency via the production of other phases and orientations. Crystallation of the deposited film was observed at temperatures as low as 400 °C for 200 mtorr O2 background. At 550 °C and 200 –300 mtorr, (100) oriented PbZrxTi1-xO3 was observed on SrTiO3 substrates.

How to Use the Features of Total Reflection of X-Rays for Energy Dispersive XRF

1988 ◽  
Vol 32 ◽  
pp. 105-114 ◽  
Author(s):  
H. Schwenke ◽  
W. Berneike ◽  
J. Knoth ◽  
U. Weisbrod
Keyword(s):  
Thin Films ◽  
Penetration Depth ◽  
Fluorescence Analysis ◽  
Total Reflection ◽  
X Rays ◽  
X Ray ◽  
Characteristic Features ◽  
Respective Characteristic ◽  
Nanometer Regime ◽  
Sensitive Method

AbstractThe total reflection of X-rays is mainly determined by three parameters , that is the orltical angle, the reflectivity and the penetration depth. For X-ray fluorescence analysis the respective characteristic features can be exploited in two rather different fields of application. In the analysis of trace elements in samples placed as thin films on optical flats, detection limits as low as 2 pg or 0.05 ppb, respectively, have been obtained. In addition, a penetration depth in the nanometer regime renders Total Reflection XRF an inherently sensitive method for the elemental analysis of surfaces. This paper outlines the main physical and constructional parameters for instrumental design and quantitation in both branches of TXRF.

In situ Hard X-ray Photoelectron Spectroscopy on the Origin of Irreversibility in Electrochromic LixWO3 Thin Films

2021 ◽  
pp. 150898
Author(s):  
Makoto Takayanagi ◽  
Takashi Tsuchiya ◽  
Shigenori Ueda ◽  
Tohru Higuchi ◽  
Kazuya Terabe
Keyword(s):  
Thin Films ◽  
Photoelectron Spectroscopy ◽  
X Ray

In Situ Testing and X Rays Radiation Effects of Pt/Bi3.15Nd0.85Ti3O12/Pt Ferroelectric Capacitors

2013 ◽  
Vol 712-715 ◽  
pp. 293-297
Author(s):  
Li Li
Keyword(s):  
Radiation Effects ◽  
Hysteresis Loops ◽  
Electrical Performance ◽  
Hysteresis Curve ◽  
X Rays ◽  
Shanghai Synchrotron Radiation Facility ◽  
X Ray ◽  
In The Beginning ◽  
Ferroelectric Capacitors

Pt/Bi3.15Nd0.85Ti3O12(BNT)/Pt ferroelectric capacitors were monitored using in situ X-ray irradiation with 10 keV at BL14B1 beamline (Shanghai Synchrotron Radiation Facility). BL14B1 combined with a ferroelectric analyzer enabled measurements in situ of electrical performance. The hysteresis curve (PE) of distortion depended on the polarization during irradiation, but the diffracted intensities of the (117) peak did not change in the beginning. ThePEcurve had a negligible change from 2.09×109Gy to 4.45×109Gy. Finally, bothPrandPr+very rapidly increased, but the intensities of (117) decreased. The hysteresis loops were remarkably deformed at the maximum total dose of 4.87×109Gy.

Applications of High-Resolution Powder X-Ray Diffraction

2007 ◽  
Vol 130 ◽  
pp. 7-14 ◽  
Author(s):  
Andrew N. Fitch
Keyword(s):  
High Resolution ◽  
Synchrotron Radiation ◽  
Powder Diffraction ◽  
X Rays ◽  
X Ray Diffraction ◽  
Crystalline Materials ◽  
X Ray ◽  
Structural Characterisation ◽  
Pdf Analysis

The highly-collimated, intense X-rays produced by a synchrotron radiation source can be harnessed to build high-resolution powder diffraction instruments with a wide variety of applications. The general advantages of using synchrotron radiation for powder diffraction are discussed and illustrated with reference to the structural characterisation of crystalline materials, atomic PDF analysis, in-situ and high-throughput studies where the structure is evolving between successive scans, and the measurement of residual strain in engineering components.

Diamond channel-cut crystals for high-heat-load beam-multiplexing narrow-band X-ray monochromators

2021 ◽  
Vol 28 (6) ◽  
Author(s):  
Yuri Shvyd'ko ◽  
Sergey Terentyev ◽  
Vladimir Blank ◽  
Tomasz Kolodziej
Keyword(s):  
Heat Load ◽  
Narrow Band ◽  
Bragg Reflection ◽  
High Heat ◽  
High Repetition Rate ◽  
X Rays ◽  
Ray Optics ◽  
X Ray ◽  
Load Beam ◽  
High Heat Load

Next-generation high-brilliance X-ray photon sources call for new X-ray optics. Here we demonstrate the possibility of using monolithic diamond channel-cut crystals as high-heat-load beam-multiplexing narrow-band mechanically stable X-ray monochromators with high-power X-ray beams at cutting-edge high-repetition-rate X-ray free-electron laser (XFEL) facilities. The diamond channel-cut crystals fabricated and characterized in these studies are designed as two-bounce Bragg reflection monochromators directing 14.4 or 12.4 keV X-rays within a 15 meV bandwidth to 57Fe or 45Sc nuclear resonant scattering experiments, respectively. The crystal design allows out-of-band X-rays transmitted with minimal losses to alternative simultaneous experiments. Only ≲2% of the incident ∼100 W X-ray beam is absorbed in the 50 µm-thick first diamond crystal reflector, ensuring that the monochromator crystal is highly stable. Other X-ray optics applications of diamond channel-cut crystals are anticipated.

Electric-field-induced lattice distortion in epitaxial BiFeO3 thin films as determined by in situ time-resolved x-ray diffraction

2017 ◽  
Vol 111 (8) ◽  
pp. 082907 ◽  
Author(s):  
Seiji Nakashima ◽  
Osami Sakata ◽  
Hiroshi Funakubo ◽  
Takao Shimizu ◽  
Daichi Ichinose ◽  
...  
Keyword(s):  
Thin Films ◽  
Electric Field ◽  
Lattice Distortion ◽  
X Ray Diffraction ◽  
Time Resolved ◽  
X Ray ◽  
Bifeo3 Thin Films

Kinetics of Ion-Exchange Reactions in Hybrid Organic–Inorganic Perovskite Thin Films Studied by In Situ Real-Time X-ray Scattering

2018 ◽  
Vol 9 (23) ◽  
pp. 6750-6754 ◽  
Author(s):  
Alessandro Greco ◽  
Alexander Hinderhofer ◽  
M. Ibrahim Dar ◽  
Neha Arora ◽  
Jan Hagenlocher ◽  
...  
Keyword(s):  
Thin Films ◽  
Ion Exchange ◽  
Real Time ◽  
Exchange Reactions ◽  
Inorganic Perovskite ◽  
X Ray ◽  
X Ray Scattering ◽  
Kinetics Of ◽  
Kinetics Of Ion Exchange
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