Error correction for Moiré based creep measurement system

2014 ◽  
Author(s):  
Yi Liao ◽  
Kevin G. Harding ◽  
Edward J. Nieters ◽  
Robert W. Tait ◽  
Wayne C. Hasz ◽  
...  
Keyword(s):  
Error Correction ◽  
Measurement System ◽  
Creep Measurement

Design of a thermostimulated creep measurement system using magnetic fields for polymers

2004 ◽  
Vol 75 (7) ◽  
pp. 2271-2275 ◽  
Author(s):  
Dogan Ogreten ◽  
Laurent Delbreilh ◽  
Colette Lacabanne
Keyword(s):  
Magnetic Fields ◽  
Measurement System ◽  
Creep Measurement

Phase Error Correction Algorithm for Grating Projection Measurement System

2014 ◽  
Vol 34 (7) ◽  
pp. 0712005 ◽  
Author(s):  
吴蜀予 Wu Shuyu ◽  
杨宜民 Yang Yimin ◽  
钟震宇 Zhong Zhenyu ◽  
卢杏坚 Lu Xingjian
Keyword(s):  
Error Correction ◽  
Measurement System ◽  
Phase Error ◽  
Correction Algorithm ◽  
Error Correction Algorithm

scholarly journals Methods for the calibrated measurement of the scattering parameters of planar multi-port devices

2007 ◽  
Vol 5 ◽  
pp. 439-445 ◽  
Author(s):  
I. Rolfes ◽  
B. Schiek
Keyword(s):  
Error Correction ◽  
Measurement System ◽  
Systematic Errors ◽  
Microwave Circuits ◽  
Calibration Procedure ◽  
Vector Network Analyzer ◽  
Switching Network ◽  
Network Analyzer ◽  
Scattering Parameters

Abstract. In this article, the error-corrected determination of complex scattering parameters of multi-port devices by means of a 2-port vector network analyzer is presented. As only two ports of the device under test can be connected to the analyzer ports at a time, the remaining device ports have to be terminated by external reflections. In order to measure the scattering parameters of the DUT without the influence of systematic errors and of the external terminations, an error correction has to be performed besides the calibration. For this purpose, the application of the multi-port procedure is presented. This method has the advantage, that the external reflective terminations can be chosen arbitrarily. Furthermore, these terminations can be unknown except for one. An automatized measurement system based on a switching network is shown, which is optimized for the measurement of planar microwave circuits. An error model for the description of the measurement setup as well as a calibration procedure for the elimination of the systematic errors are presented.

scholarly journals Error Correction of Weak Current Measurement System Based on Wavelet Denoising and Generalized Regression Neural Network

2021 ◽  
Vol 20 (2) ◽  
pp. 91-99
Author(s):  
Dapeng Wen ◽  
Xiyin Liang ◽  
Maogen Su ◽  
Meng Wu ◽  
Ruilin Chen ◽  
...  
Keyword(s):  
Neural Network ◽  
Measurement Error ◽  
Error Correction ◽  
Measurement System ◽  
Current Measurement ◽  
Least Square ◽  
Generalized Regression Neural Network ◽  
Weak Current ◽  
Generalized Regression ◽  
Measurement Error Correction

Aiming at the problems that the weak current signal circuit is susceptible to noise interference and leakage current at the input terminal affects the measurement accuracy, a weak current measurement error correction scheme based on the combination of wavelet threshold denoising and generalized regression neural network (GRNN) was proposed. The scheme was applied to the error correction of multi-channel weak current measurement system based on the ADAS1134 chip: the wavelet threshold denoising was used to preprocess the original current data measured by the system and the current measurement value was corrected after the system measurement error correction model established with GRNN was constructed. Compared with the correction method based on least square method and back propagation neural network (BPNN), this method has many advantages such as high accuracy, anti-interference ability and strong generalization ability. The experimental results showed that RMSE=0.0911 nA, MAE=0.0354 nA, and MAPE=0.0078%, without increasing the complexity of the measurement circuit, which achieved the purpose of correcting the measurement error of the weak current measurement system.

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