scholarly journals Methods for the calibrated measurement of the scattering parameters of planar multi-port devices

2007 ◽  
Vol 5 ◽  
pp. 439-445 ◽  
Author(s):  
I. Rolfes ◽  
B. Schiek
Keyword(s):  
Error Correction ◽  
Measurement System ◽  
Systematic Errors ◽  
Microwave Circuits ◽  
Calibration Procedure ◽  
Vector Network Analyzer ◽  
Switching Network ◽  
Network Analyzer ◽  
Scattering Parameters

Abstract. In this article, the error-corrected determination of complex scattering parameters of multi-port devices by means of a 2-port vector network analyzer is presented. As only two ports of the device under test can be connected to the analyzer ports at a time, the remaining device ports have to be terminated by external reflections. In order to measure the scattering parameters of the DUT without the influence of systematic errors and of the external terminations, an error correction has to be performed besides the calibration. For this purpose, the application of the multi-port procedure is presented. This method has the advantage, that the external reflective terminations can be chosen arbitrarily. Furthermore, these terminations can be unknown except for one. An automatized measurement system based on a switching network is shown, which is optimized for the measurement of planar microwave circuits. An error model for the description of the measurement setup as well as a calibration procedure for the elimination of the systematic errors are presented.

scholarly journals An Error Correction Procedure for Multi-Port Measurements at High Frequencies

2005 ◽  
Vol 3 ◽  
pp. 59-64
Author(s):  
I. Rolfes ◽  
B. Schiek
Keyword(s):  
Error Correction ◽  
Short Circuit ◽  
Correction Method ◽  
Frequency Characteristics ◽  
Vector Network Analyzer ◽  
Network Analyzer ◽  
Correction Procedure ◽  
Scattering Parameters ◽  
High Frequencies ◽  
Port Device

Abstract. The multi-port method for the measurement of the scattering parameters of multi-ports with the help of a vector network analyzer (VNA) with only two measurement ports is presented. For the measurements only two ports of the N-port device can be connected to the two ports of the VNA at a time. The remaining N-2 ports of the device under test (DUT) are connected to external terminations. As these external terminations might be mismatched, the measured scattering parameters depend on the reflective characteristics of the terminations. An error correction becomes necessary in order to calculate the effective scattering parameters of the DUT (Tippet and Speciale, 1982; Lu and Chu, 2003). In contrast to the correction method of Tippet and Speciale (1982), the multi-port method has the advantage, that the external terminations can be chosen arbitrarily. Thus, a realization as an open or short circuit is possible as well. Furthermore, the terminations can be unknown except for one, similar to self-calibration procedures of VNAs. This helps to improve the accuracy of the measurements, because the inconsistency problem due to a slightly erroneous knowledge of the frequency characteristics of the terminations can be eliminated.

scholarly journals Accurate determination of terahertz optical constants by vector network analyzer of Fabry–Perot response

2013 ◽  
Vol 38 (24) ◽  
pp. 5438 ◽  
Author(s):  
Wenfeng Sun ◽  
Bin Yang ◽  
Xinke Wang ◽  
Yan Zhang ◽  
Robert Donnan
Keyword(s):  
Optical Constants ◽  
Accurate Determination ◽  
Vector Network Analyzer ◽  
Network Analyzer ◽  
Fabry Perot

Accuracy Improvement for Scattering-Parameters Evaluating of Microwave Coplanar Probe Using One-Port Two-Tier Multi-TRL Calibration Method

2013 ◽  
Vol 333-335 ◽  
pp. 254-258 ◽  
Author(s):  
Hui Huang ◽  
Xin Meng Liu ◽  
Xin Lv
Keyword(s):  
Calibration Method ◽  
Vector Network Analyzer ◽  
Network Analyzer ◽  
Random Errors ◽  
Scattering Parameters ◽  
Accuracy Improvement ◽  
S Parameters ◽  
Improving Accuracy ◽  
System Errors ◽  
Residual Errors

This paper presents a method improving accuracy for evaluating S-parameters (Scattering-parameters) of MCP (Microwave Coplanar Probe). This method may be named one-port two-tier Multi-TRL (Thru-Reflect-Line) calibration method. It measures two-port devices only at one port of VNA (Vector Network Analyzer). It decreases the random errors caused of cable movements and connecting times. This method is implemented with coaxial OSL (Open-Short-Load) and on-wafer TRL calibration kit. It directly calculates and removes the residual errors caused of coaxial OSL calibration kit imperfection. It significantly reduced system errors by using on-wafer TRL calibration kit. To verify the effectiveness of the proposed method, the measured S-parameters up to 50GHz of MCP configured with GSG-100 are given and discussed.

A Coaxial Measurement System for Electromagnetic Parameters at Microwave Frequencies

2014 ◽  
Vol 881-883 ◽  
pp. 1832-1835
Author(s):  
Xing Liu ◽  
Xian Yan Chen ◽  
Yuan Lin ◽  
Long Fang Ye ◽  
Fen Xiao ◽  
...  
Keyword(s):  
Data Processing ◽  
Measurement System ◽  
High Accuracy ◽  
Network Analyzer ◽  
Scattering Parameters ◽  
Electromagnetic Parameters ◽  
Frequency Sweep ◽  
Microwave Frequencies ◽  
Absorbing Materials ◽  
Processing Techniques

In this paper, an improved coaxial measurement system with a newly designed coaxial fixture is presented. The electromagnetic parameters of samples are retrieved from the scattering parameters measured by a vector network analyzer (VNA) at microwave frequencies. The measurements of air and PTFE in the range of 1~6 GHz were carried out to verify the reliability and the accuracy of this measurement system. By using frequency-sweep and data processing techniques, the multiplicity of roots is eliminated. The results show that this system can effectively be applied to measure the material electromagnetic parameters of absorbing materials with high accuracy in a wide frequency band.

scholarly journals Calibration-measurement unit for the automation of vector network analyzer measurements

2008 ◽  
Vol 6 ◽  
pp. 27-30
Author(s):  
I. Rolfes ◽  
B. Will ◽  
B. Schiek
Keyword(s):  
Vector Network Analyzer ◽  
Measurement Unit ◽  
Network Analyzer ◽  
Scattering Parameters ◽  
Calibration Standards ◽  
Calibration Measurement ◽  
Vector Network Analyzers ◽  
Network Analyzers ◽  
The One ◽  
User Friendly

Abstract. With the availability of multi-port vector network analyzers, the need for automated, calibrated measurement facilities increases. In this contribution, a calibration-measurement unit is presented which realizes a repeatable automated calibration of the measurement setup as well as a user-friendly measurement of the device under test (DUT). In difference to commercially available calibration units, which are connected to the ports of the vector network analyzer preceding a measurement and which are then removed so that the DUT can be connected, the presented calibration-measurement unit is permanently connected to the ports of the VNA for the calibration as well as for the measurement of the DUT. This helps to simplify the calibrated measurement of complex scattering parameters. Moreover, a full integration of the calibration unit into the analyzer setup becomes possible. The calibration-measurement unit is based on a multiport switch setup of e.g. electromechanical relays. Under the assumption of symmetry of a switch, on the one hand the unit realizes the connection of calibration standards like one-port reflection standards and two-port through connections between different ports and on the other hand it enables the connection of the DUT. The calibration-measurement unit is applicable for two-port VNAs as well as for multiport VNAs. For the calibration of the unit, methods with completely known calibration standards like SOLT (short, open, load, through) as well as self-calibration procedures like TMR or TLR can be applied.

Sign in / Sign up

Export Citation Format

Share Document