Fabrication and electrical characterization of Pd/TiO2/n-Si MIS structure using TiO2film as insulator layer deposited by low temperature arc vapor deposition process
2012 ◽
Vol 12
(5)
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pp. 3760-3765
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1988 ◽
Vol 1
(1)
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pp. 131-134
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1990 ◽
Vol 34
(6)
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pp. 806-815
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