Image force effects and the dielectric response of SiO2 in electron transport across metal–oxide–semiconductor structures

1997 ◽  
Vol 15 (3) ◽  
pp. 784-789 ◽  
Author(s):  
H. J. Wen ◽  
R. Ludeke ◽  
D. M. Newns ◽  
S. H. Lo
Keyword(s):  
Electron Transport ◽  
Metal Oxide ◽  
Dielectric Response ◽  
Image Force ◽  
Metal Oxide Semiconductor ◽  
Oxide Semiconductor ◽  
Semiconductor Structures

Interface/border trap characterization of Al2O3/AlN/GaN metal-oxide-semiconductor structures with an AlN interfacial layer

2015 ◽  
Vol 106 (5) ◽  
pp. 051605 ◽  
Author(s):  
Shenghou Liu ◽  
Shu Yang ◽  
Zhikai Tang ◽  
Qimeng Jiang ◽  
Cheng Liu ◽  
...  
Keyword(s):  
Metal Oxide ◽  
Interfacial Layer ◽  
Metal Oxide Semiconductor ◽  
Oxide Semiconductor ◽  
Semiconductor Structures
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