Investigation of roughened silicon surfaces using fractal analysis. II. Chemical etching, rapid thermal chemical vapor deposition, and thermal oxidation
1994 ◽
Vol 12
(5)
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pp. 2653-2661
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2004 ◽
Vol 13
(4-8)
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pp. 1274-1280
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2001 ◽
Vol 21
(10-11)
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pp. 2095-2098
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2015 ◽
Vol 648
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pp. 1104-1108
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2002 ◽
Vol 361
(3-4)
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pp. 189-195
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2017 ◽
Vol 121
(47)
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pp. 26465-26471
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2009 ◽
Vol 18
(2-3)
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pp. 307-311
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