Depth profiling and interface analysis using spectroscopic ellipsometry

1982 ◽  
Vol 20 (3) ◽  
pp. 471-475 ◽  
Author(s):  
J. B. Theeten ◽  
M. Erman
Keyword(s):  
Spectroscopic Ellipsometry ◽  
Depth Profiling ◽  
Interface Analysis

Nondestructive depth profiling by spectroscopic ellipsometry

1985 ◽  
Vol 47 (4) ◽  
pp. 339-341 ◽  
Author(s):  
K. Vedam ◽  
P. J. McMarr ◽  
J. Narayan
Keyword(s):  
Spectroscopic Ellipsometry ◽  
Depth Profiling

Nondestructive Depth-Profiling of Multilayer Structures by Spectroscopic Ellipsometry

MRS Bulletin ◽  
1987 ◽  
Vol 12 (1) ◽  
pp. 21-23 ◽  
Author(s):  
K. Vedam
Keyword(s):  
Spectroscopic Ellipsometry ◽  
Monochromatic Light ◽  
Depth Profiling ◽  
Apple Computer ◽  
Multilayer Structures ◽  
Angle Of Incidence ◽  
Reflected Light ◽  
Detector Output ◽  
On Line ◽  
Proper Design

Spectroscopic ellipsometry (SE) is the newest nondestructive and nonperturbing technique for characterizing surfaces, interfaces, and multilayer structures. The technique was originally developed and perfected by Aspnes of Bell Laboratories and a commercial instrument is currently available. After a brief description of the basic principles involved in this technique, one of its many applications — the depth profiling of multilayer structures — is described. Further details about SE and its other applications can be found elsewhere.The automated spectroscopic ellipsometer that has been built in our laboratory is based on the design of Aspnes and Studna. A schematic diagram of the instrument is shown in Figure 1. It is basically a rotating analyzer ellipsometer operated by an on-line Apple computer, and it has spectroscopic scanning capability. Plane polarized monochromatic light is allowed to be incident on the sample at a chosen angle of incidence. The characteristics of the elliptically polarized reflected light is analyzed by a rotating analyzer. As Budde has shown, Fourier analysis of the detector output in a rotating analyzer ellipsometer yields the desired ellipsometric parameters Δ and ψ characterizing the material under study. Aspnes has pointed out that with proper design, alignment and operation, the precision attained is very high, and accuracy of the data is also as high as that attainable with null ellipsometers. The results of our own studies confirm these conclusions. Such measurements are carried out at a number of discrete wavelengths (˜100) distributed uniformly in the UV-visible-near IR spectral range.

Optical gradients in a-Si:H thin films detected using real-time spectroscopic ellipsometry with virtual interface analysis

2018 ◽  
Vol 436 ◽  
pp. 779-784
Author(s):  
Maxwell M. Junda ◽  
Laxmi Karki Gautam ◽  
Robert W. Collins ◽  
Nikolas J. Podraza
Keyword(s):  
Thin Films ◽  
Real Time ◽  
Spectroscopic Ellipsometry ◽  
Virtual Interface ◽  
Interface Analysis

Characterization of Multilayered Automotive Paint Systems Including Depth Profiling and Interface Analysis

1997 ◽  
pp. 279-300 ◽  
Author(s):  
Karlis Adamsons ◽  
Kathryn Lloyd ◽  
Katherine Stika ◽  
Dennis Swartzfager ◽  
Dennis Walls ◽  
...  
Keyword(s):  
Depth Profiling ◽  
Interface Analysis ◽  
Paint Systems ◽  
Automotive Paint

AES depth profiling and interface analysis of C/Ta bilayers

2005 ◽  
Vol 252 (5) ◽  
pp. 2056-2062 ◽  
Author(s):  
A. Zalar ◽  
J. Kovač ◽  
B. Praček ◽  
S. Hofmann ◽  
P. Panjan
Keyword(s):  
Depth Profiling ◽  
Interface Analysis
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