Nondestructive characterization of interface layers between Si or GaAs and their oxides by spectroscopic ellipsometry

1979 ◽  
Vol 16 (5) ◽  
pp. 1374-1378 ◽  
Author(s):  
D. E. Aspnes ◽  
J. B. Theeten ◽  
R. P. H. Chang
Keyword(s):  
Spectroscopic Ellipsometry ◽  
Interface Layers ◽  
Nondestructive Characterization

scholarly journals Nondestructive characterization of nitrogen‐implanted silicon‐on‐insulator structures by spectroscopic ellipsometry

1989 ◽  
Vol 66 (10) ◽  
pp. 5052-5057 ◽  
Author(s):  
M. Fried ◽  
T. Lohner ◽  
J. M. M. de Nijs ◽  
A. van Silfhout ◽  
L. J. Hanekamp ◽  
...  
Keyword(s):  
Spectroscopic Ellipsometry ◽  
Silicon On Insulator ◽  
Nondestructive Characterization

A Possible Basis for Nondestructive Characterization of Ropes of Nylon 6

1997 ◽  
Vol 503 ◽  
Author(s):  
H. Jiang ◽  
M. K. Davis ◽  
R. K. Eby ◽  
P. Arsenovic
Keyword(s):  
Tensile Strength ◽  
Service Life ◽  
Fiber Diameter ◽  
Structural Parameters ◽  
Crystal Form ◽  
Nylon 6 ◽  
Remaining Service Life ◽  
Nondestructive Characterization ◽  
Fractional Content

ABSTRACTPhysical properties and structural parameters have been measured for ropes of nylon 6 as a function of the number of use operations. The fractional content of the α crystal form, sound velocity, birefringence, tensile strength and length all increase systematically and significantly with increasing the number of use operations. The fractional content of the γ crystal form and fiber diameter decrease with use. These trends indicate that the measurement of such properties and structural parameters, especially the length, provide a possible basis for establishing a reliable, rapid, and convenient nondestructive characterization method to predict the remaining service life of nylon 6 ropes.

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