Nondestructive characterization of textured a-Si:H/c-Si heterojunction solar cell structures with nanometer-scale a-Si:H and In2O3:Sn layers by spectroscopic ellipsometry

2013 ◽  
Vol 114 (4) ◽  
pp. 043101 ◽  
Author(s):  
Nobuyuki Matsuki ◽  
Hiroyuki Fujiwara
Keyword(s):  
Solar Cell ◽  
Spectroscopic Ellipsometry ◽  
Heterojunction Solar Cell ◽  
Nanometer Scale ◽  
Cell Structures ◽  
Nondestructive Characterization

scholarly journals Characterization of μc-Si:H/a-Si:H tandem solar cell structures by spectroscopic ellipsometry

2014 ◽  
Vol 571 ◽  
pp. 756-761 ◽  
Author(s):  
Daisuke Murata ◽  
Tetsuya Yuguchi ◽  
Hiroyuki Fujiwara
Keyword(s):  
Solar Cell ◽  
Spectroscopic Ellipsometry ◽  
Tandem Solar Cell ◽  
Cell Structures

Characterization of InGaAsN solar-cell structures on Ge substrates

2014 ◽  
Vol 11 (3-4) ◽  
pp. 561-564 ◽  
Author(s):  
K. Uesugi ◽  
S. Kuboya ◽  
S. Sanorpim ◽  
K. Onabe
Keyword(s):  
Solar Cell ◽  
Cell Structures

Correlation of Small-Angle X-Ray Scattering and Solar Cell Performance of a-SiGe:H Alloys

1993 ◽  
Vol 297 ◽  
Author(s):  
S.J. Jones ◽  
Y. Chen ◽  
D.L. Williamson ◽  
X. Xu ◽  
J. Yang ◽  
...  
Keyword(s):  
Solar Cell ◽  
Small Angle ◽  
Film Surface ◽  
Nanometer Scale ◽  
Low Density ◽  
Solar Cell Performance ◽  
X Ray ◽  
X Ray Scattering ◽  
Cell Structures ◽  
Ray Scattering

Small-angle x-ray scattering (SAXS) measurements were made on a-SiGe:H alloys to study microstructure on the nanometer scale as a function of Ge content, and the results were compared with representative single-junction solar cell properties. Samples consisting of only the i-layer were used for SAXS. Above a Ge content of 20 %, a significant increase in SAXS was seen. From measurements made with the samples tilted relative to the incident x-ray beam, the increase in scattering is attributed to the appearance of elongated low density regions in the film, modeled as ellipsoidal microvoids, which are preferentially oriented perpendicular to the film surface and may be related to columnar-like microstructure. Flotation density measurements support the presence of low density regions. Initial and light-degraded measurements on corresponding solar cell structures do not show a correlation between SAXS and initial cell properties; there is, however, some evidence that the light-induced degradation is higher for cells with larger amounts of SAXS-detected microstructure and this needs further investigation.

Real time spectroscopic ellipsometry for characterization and optimization of amorphous silicon-based solar cell structures

1998 ◽  
Vol 313-314 ◽  
pp. 469-473 ◽  
Author(s):  
Joohyun Koh ◽  
H. Fujiwara ◽  
Yiwei Lu ◽  
C.R. Wronski ◽  
R.W. Collins
Keyword(s):  
Solar Cell ◽  
Amorphous Silicon ◽  
Real Time ◽  
Spectroscopic Ellipsometry ◽  
Cell Structures ◽  
Silicon Based
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