New insight into desorption step by Ar+ ion-bombardment during the atomic layer etching of silicon

2018 ◽  
Vol 36 (3) ◽  
pp. 031303 ◽  
Author(s):  
Sonam D. Sherpa ◽  
Peter L. G. Ventzek ◽  
Myungsuk Lee ◽  
Gyeong S. Hwang ◽  
Alok Ranjan
Keyword(s):  
Atomic Layer ◽  
Ion Bombardment ◽  
Atomic Layer Etching ◽  
Desorption Step ◽  
Insight Into

Computational modelling of atomic layer etching of chlorinated germanium surfaces by argon

2019 ◽  
Vol 21 (11) ◽  
pp. 5898-5902
Author(s):  
Shenli Zhang ◽  
Yihan Huang ◽  
Gulcin Tetiker ◽  
Saravanapriyan Sriraman ◽  
Alex Paterson ◽  
...  
Keyword(s):  
Computational Modelling ◽  
Atomic Layer ◽  
Ion Bombardment ◽  
Surface Layers ◽  
Bombardment Energy ◽  
Atomic Layer Etching

Cl ion bombardment energy is clearly responsible for disturbing Ge surface layers.

Damaged silicon contact layer removal using atomic layer etching for deep-nanoscale semiconductor devices

2013 ◽  
Vol 31 (6) ◽  
pp. 061310 ◽  
Author(s):  
Jong Kyu Kim ◽  
Sung Il Cho ◽  
Sung Ho Lee ◽  
Chan Kyu Kim ◽  
Kyung Suk Min ◽  
...  
Keyword(s):  
Semiconductor Devices ◽  
Atomic Layer ◽  
Contact Layer ◽  
Layer Removal ◽  
Atomic Layer Etching

Understanding time-resolved processes in atomic-layer etching of ultra-thin Al2O3 film using BCl3 and Ar neutral beam

2014 ◽  
Vol 105 (9) ◽  
pp. 093104 ◽  
Author(s):  
Young I. Jhon ◽  
Kyung S. Min ◽  
G. Y. Yeom ◽  
Young Min Jhon
Keyword(s):  
Atomic Layer ◽  
Neutral Beam ◽  
Al2o3 Film ◽  
Time Resolved ◽  
Atomic Layer Etching

(Invited) Volatile Products during Thermal Atomic Layer Etching of Metal Oxides and Elemental Metals

2021 ◽  
Vol MA2021-01 (21) ◽  
pp. 844-844
Author(s):  
Ann Lii-Rosales ◽  
Virginia Johnson ◽  
Sandeep Sharma ◽  
Andrew S Cavanagh ◽  
Steven M George
Keyword(s):  
Metal Oxides ◽  
Atomic Layer ◽  
Volatile Products ◽  
Atomic Layer Etching

Prediction and Validation of the Process Window for Atomic Layer Etching: HF Exposure on TiO2

2021 ◽  
Author(s):  
Suresh Kondati Natarajan ◽  
Austin M. Cano ◽  
Jonathan L. Partridge ◽  
Steven M. George ◽  
Simon D. Elliott
Keyword(s):  
Atomic Layer ◽  
Process Window ◽  
Atomic Layer Etching

scholarly journals Predicting synergy in atomic layer etching

2017 ◽  
Vol 35 (5) ◽  
pp. 05C302 ◽  
Author(s):  
Keren J. Kanarik ◽  
Samantha Tan ◽  
Wenbing Yang ◽  
Taeseung Kim ◽  
Thorsten Lill ◽  
...  
Keyword(s):  
Atomic Layer ◽  
Atomic Layer Etching

Thermal Atomic Layer Etching of Silicon Using O2, HF, and Al(CH3)3 as the Reactants

2018 ◽  
Vol 30 (23) ◽  
pp. 8465-8475 ◽  
Author(s):  
Aziz I. Abdulagatov ◽  
Steven M. George
Keyword(s):  
Atomic Layer ◽  
Atomic Layer Etching

Ion Bombardment during Plasma-Assisted Atomic Layer Deposition

2013 ◽  
Vol 50 (13) ◽  
pp. 23-34 ◽  
Author(s):  
H. B. Profijt ◽  
W. M. M. Kessels
Keyword(s):  
Atomic Layer Deposition ◽  
Atomic Layer ◽  
Ion Bombardment ◽  
Layer Deposition
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