Nanoscale Schottky barrier mapping of thermally evaporated and sputter deposited W/Si(001) diodes using ballistic electron emission microscopy
2016 ◽
Vol 34
(4)
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pp. 04J110
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1999 ◽
Vol 14
(9)
◽
pp. 871-877
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1993 ◽
Vol 11
(4)
◽
pp. 1584
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