Ballistic-electron emission microscopy at metal/GaP(110) interfaces: Electron transport and Schottky-barrier heights

A. Bauer

doi:10.1116/1.586974

Ballistic-electron emission microscopy at metal/GaP(110) interfaces: Electron transport and Schottky-barrier heights

Journal of Vacuum Science & Technology B Microelectronics Processing and Phenomena ◽

10.1116/1.586974 ◽

1993 ◽

Vol 11 (4) ◽

pp. 1584 ◽

Cited By ~ 13

Author(s):

A. Bauer

Keyword(s):

Electron Transport ◽

Schottky Barrier ◽

Electron Emission ◽

Ballistic Electron Emission Microscopy ◽

Barrier Heights ◽

Ballistic Electron ◽

Emission Microscopy

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Ballistic electron emission microscopy: from electron transport physics to nanoscale materials science

10.1117/12.183190 ◽

1993 ◽

Author(s):

Hans D. Hallen

Keyword(s):

Electron Transport ◽

Electron Emission ◽

Materials Science ◽

Nanoscale Materials ◽

Ballistic Electron Emission Microscopy ◽

Ballistic Electron ◽

Emission Microscopy

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Cross Sectional Ballistic Electron Emission Microscopy for Schottky Barrier Height Profiling on Heterostructures

Japanese Journal of Applied Physics ◽

10.1143/jjap.45.2204 ◽

2006 ◽

Vol 45 (3B) ◽

pp. 2204-2207

Author(s):

Doris Rakoczy ◽

Gottfried Strasser ◽

Jürgen Smoliner

Keyword(s):

Schottky Barrier ◽

Barrier Height ◽

Electron Emission ◽

Schottky Barrier Height ◽

Ballistic Electron Emission Microscopy ◽

Cross Sectional ◽

Ballistic Electron ◽

Emission Microscopy

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L-valley electron transport in GaAs-AlAs double-barrier resonant tunneling structures studied by ballistic electron emission microscopy

Physical Review B ◽

10.1103/physrevb.66.033309 ◽

2002 ◽

Vol 66 (3) ◽

Cited By ~ 8

Author(s):

D. Rakoczy ◽

G. Strasser ◽

C. Strahberger ◽

J. Smoliner

Keyword(s):

Electron Transport ◽

Electron Emission ◽

Resonant Tunneling ◽

Ballistic Electron Emission Microscopy ◽

Double Barrier ◽

Ballistic Electron ◽

Emission Microscopy ◽

Double Barrier Resonant Tunneling

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Ballistic electron emission microscopy for local measurements of barrier heights on InAs self-assembled quantum dots on GaAs

Physica B Condensed Matter ◽

10.1016/s0921-4526(01)01384-9 ◽

2002 ◽

Vol 314 (1-4) ◽

pp. 81-85 ◽

Cited By ~ 3

Author(s):

D. Rakoczy ◽

G. Strasser ◽

J. Smoliner

Keyword(s):

Quantum Dots ◽

Electron Emission ◽

Ballistic Electron Emission Microscopy ◽

Barrier Heights ◽

Ballistic Electron ◽

Local Measurements ◽

Emission Microscopy ◽

Self Assembled

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Conduction band energies and hot-electron transport characteristics of epitaxial Sc2O3∕Si (111) studied by ballistic electron emission microscopy and internal photoemission

Applied Physics Letters ◽

10.1063/1.2757150 ◽

2007 ◽

Vol 91 (4) ◽

pp. 042901 ◽

Cited By ~ 8

Author(s):

W. Cai ◽

S. E. Stone ◽

J. P. Pelz ◽

L. F. Edge ◽

D. G. Schlom

Keyword(s):

Electron Transport ◽

Conduction Band ◽

Electron Emission ◽

Hot Electron ◽

Ballistic Electron Emission Microscopy ◽

Internal Photoemission ◽

Ballistic Electron ◽

Emission Microscopy ◽

Hot Electron Transport

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Time dependent changes in Schottky barrier mapping of the W/Si(001) interface utilizing ballistic electron emission microscopy

Journal of Applied Physics ◽

10.1063/1.4922972 ◽

2015 ◽

Vol 117 (24) ◽

pp. 245306 ◽

Cited By ~ 9

Author(s):

Chris A. Durcan ◽

Robert Balsano ◽

Vincent P. LaBella

Keyword(s):

Schottky Barrier ◽

Electron Emission ◽

Time Dependent ◽

Ballistic Electron Emission Microscopy ◽

Ballistic Electron ◽

Emission Microscopy

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Measuring spin dependent hot electron transport through a metal-semiconductor interface using spin-polarized ballistic electron emission microscopy

Physical Review B ◽

10.1103/physrevb.76.195311 ◽

2007 ◽

Vol 76 (19) ◽

Cited By ~ 3

Author(s):

A. J. Stollenwerk ◽

M. R. Krause ◽

J. J. Garramone ◽

E. J. Spadafora ◽

V. P. LaBella

Keyword(s):

Electron Transport ◽

Electron Emission ◽

Hot Electron ◽

Ballistic Electron Emission Microscopy ◽

Semiconductor Interface ◽

Ballistic Electron ◽

Spin Polarized ◽

Emission Microscopy ◽

Hot Electron Transport

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Modification of GaN Schottky barrier interfaces probed by ballistic-electron-emission microscopy and spectroscopy

Applied Physics Letters ◽

10.1063/1.126148 ◽

2000 ◽

Vol 76 (13) ◽

pp. 1725-1727 ◽

Cited By ~ 10

Author(s):

L. D. Bell ◽

R. P. Smith ◽

B. T. McDermott ◽

E. R. Gertner ◽

R. Pittman ◽

...

Keyword(s):

Schottky Barrier ◽

Electron Emission ◽

Ballistic Electron Emission Microscopy ◽

Ballistic Electron ◽

Emission Microscopy

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Hot electron transport studies of the Cu/Si(001) interface using ballistic electron emission microscopy

Journal of Vacuum Science & Technology B Microelectronics and Nanometer Structures Processing Measurement and Phenomena ◽

10.1116/1.3136761 ◽

2009 ◽

Vol 27 (4) ◽

pp. 2044 ◽

Cited By ~ 10

Author(s):

J. J. Garramone ◽

J. R. Abel ◽

I. L. Sitnitsky ◽

R. L. Moore ◽

V. P. LaBella

Keyword(s):

Electron Transport ◽

Electron Emission ◽

Hot Electron ◽

Ballistic Electron Emission Microscopy ◽

Ballistic Electron ◽

Transport Studies ◽

Emission Microscopy ◽

Hot Electron Transport

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Nanoscale Schottky barrier mapping of thermally evaporated and sputter deposited W/Si(001) diodes using ballistic electron emission microscopy

Journal of Vacuum Science & Technology B Nanotechnology and Microelectronics Materials Processing Measurement and Phenomena ◽

10.1116/1.4958721 ◽

2016 ◽

Vol 34 (4) ◽

pp. 04J110 ◽

Cited By ~ 4

Author(s):

Westly Nolting ◽

Chris Durcan ◽

Avyaya J. Narasimham ◽

Vincent P. LaBella

Keyword(s):

Schottky Barrier ◽

Electron Emission ◽

Ballistic Electron Emission Microscopy ◽

Ballistic Electron ◽

Emission Microscopy ◽

Sputter Deposited

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