Physical and Technical Problems of SOI Structures and Devices
Latest Publications

TOTAL DOCUMENTS

(FIVE YEARS 0)

H-INDEX

(FIVE YEARS 0)

Published By Springer Netherlands

9789401040525, 9789401101097

Latest Documents Most Cited Documents Contributed Authors Related Sources Related Keywords

Semi-Insulating Oxygen-Doped Silicon by Low Temperature Chemical Vapor Deposition for SOI Applications

Physical and Technical Problems of SOI Structures and Devices ◽

10.1007/978-94-011-0109-7_5 ◽

1995 ◽

pp. 55-66

Author(s):

J. C. Sturm ◽

P. V. Schwartz ◽

Z. Liliental-Weber

Keyword(s):

Chemical Vapor Deposition ◽

Low Temperature ◽

Vapor Deposition ◽

Chemical Vapor ◽

Doped Silicon

Download Full-text

Defect Engineering in SOI Films Prepared by Zone-Melting Recrystallization

Physical and Technical Problems of SOI Structures and Devices ◽

10.1007/978-94-011-0109-7_3 ◽

1995 ◽

pp. 27-38 ◽

Cited By ~ 6

Author(s):

E. I. Givargizov ◽

V. A. Loukin ◽

A. B. Limanov

Keyword(s):

Zone Melting ◽

Defect Engineering

Download Full-text

SOI Pressure Sensors Based on Laser Recrystallized Polysilicon

Physical and Technical Problems of SOI Structures and Devices ◽

10.1007/978-94-011-0109-7_25 ◽

1995 ◽

pp. 281-286 ◽

Cited By ~ 2

Author(s):

V. A. Voronin ◽

I. I. Maryamova ◽

A. A. Druzhinin ◽

E. N. Lavitska ◽

Y. M. Pankov

Keyword(s):

Pressure Sensors

Download Full-text

1.2 µm CMOS/SOI on Porous Silicon

Physical and Technical Problems of SOI Structures and Devices ◽

10.1007/978-94-011-0109-7_24 ◽

1995 ◽

pp. 275-280 ◽

Cited By ~ 4

Author(s):

V. P. Bondarenko ◽

Y. V. Bogatirev ◽

L. N. Dolgyi ◽

A. M. Dorofeev ◽

A. K. Panfilenko ◽

...

Keyword(s):

Porous Silicon

Download Full-text

Low-Frequency Noise Characterisation of Silicon-On-Insulator Depletion-Mode p-MOSFETS

Physical and Technical Problems of SOI Structures and Devices ◽

10.1007/978-94-011-0109-7_22 ◽

1995 ◽

pp. 247-252 ◽

Cited By ~ 2

Author(s):

N. B. Lukyanchikova ◽

M. V. Petrichuk ◽

N. P. Garbar ◽

E. Simoen ◽

C. Claeys

Keyword(s):

Low Frequency ◽

Silicon On Insulator ◽

Frequency Noise ◽

Low Frequency Noise

Download Full-text

Hot Carrier Reliability of SOI Structures

Physical and Technical Problems of SOI Structures and Devices ◽

10.1007/978-94-011-0109-7_18 ◽

1995 ◽

pp. 199-210 ◽

Cited By ~ 2

Author(s):

D. E. Ioannou

Keyword(s):

Hot Carrier

Download Full-text

Fabrication and Characterisation of Poly-Si TFTs on Glass

Physical and Technical Problems of SOI Structures and Devices ◽

10.1007/978-94-011-0109-7_17 ◽

1995 ◽

pp. 183-198 ◽

Cited By ~ 9

Author(s):

S. D. Brotherton ◽

J. R. Ayres ◽

D. J. McCulloch ◽

N. D. Young

Download Full-text

Electrical Properties of ZMR SOI Structures: Characterization Techniques and Experimental Results

Physical and Technical Problems of SOI Structures and Devices ◽

10.1007/978-94-011-0109-7_16 ◽

1995 ◽

pp. 169-180 ◽

Cited By ~ 6

Author(s):

T. E. Rudenko ◽

A. N. Rudenko ◽

V. S. Lysenko

Keyword(s):

Electrical Properties ◽

Experimental Results ◽

Characterization Techniques

Download Full-text

Electrical Characterization Techniques for Silicon on Insulator Materials and Devices

Physical and Technical Problems of SOI Structures and Devices ◽

10.1007/978-94-011-0109-7_12 ◽

1995 ◽

pp. 109-132 ◽

Cited By ~ 2

Author(s):

Sorin Cristoloveanu

Keyword(s):

Electrical Characterization ◽

Silicon On Insulator ◽

Characterization Techniques

Download Full-text

Direct Formation of Thin Film Nitride Structures by High Intensity Ion Implantation of Nitrogen into Silicon

Physical and Technical Problems of SOI Structures and Devices ◽

10.1007/978-94-011-0109-7_6 ◽

1995 ◽

pp. 67-72

Author(s):

Rossen Yankov ◽

Fadey Komarov

Keyword(s):

Thin Film ◽

Ion Implantation ◽

High Intensity ◽

Direct Formation

Download Full-text

Physical and Technical Problems of SOI Structures and DevicesLatest Publications

TOTAL DOCUMENTS

H-INDEX

Published By Springer Netherlands

Semi-Insulating Oxygen-Doped Silicon by Low Temperature Chemical Vapor Deposition for SOI Applications

Defect Engineering in SOI Films Prepared by Zone-Melting Recrystallization

SOI Pressure Sensors Based on Laser Recrystallized Polysilicon

1.2 µm CMOS/SOI on Porous Silicon

Low-Frequency Noise Characterisation of Silicon-On-Insulator Depletion-Mode p-MOSFETS

Hot Carrier Reliability of SOI Structures

Fabrication and Characterisation of Poly-Si TFTs on Glass

Electrical Properties of ZMR SOI Structures: Characterization Techniques and Experimental Results

Electrical Characterization Techniques for Silicon on Insulator Materials and Devices

Direct Formation of Thin Film Nitride Structures by High Intensity Ion Implantation of Nitrogen into Silicon

Physical and Technical Problems of SOI Structures and Devices
Latest Publications