Interface states mediated reverse leakage through metal/AlxGa1−xN∕GaN Schottky diodes
2008 ◽
Vol 26
(6)
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pp. 1987-1992
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2008 ◽
Vol 85
(1)
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pp. 233-237
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1989 ◽
Vol 7
(5)
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pp. 1096
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2001 ◽
Vol 87
(2)
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pp. 141-147
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1987 ◽
Vol 2
(12)
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pp. 779-782
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1991 ◽
Vol 10
(10)
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pp. 556-558
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1991 ◽
Vol 38-41
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pp. 1409-1414
2008 ◽
Vol 85
(7)
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pp. 1495-1501
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Keyword(s):
2015 ◽
Vol 15
(2)
◽
pp. 1-9
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Keyword(s):