Silicon single-electron transistor with oxide tunnel barriers fabricated using chemical mechanical polishing

Author(s):  
Vishwanath Joshi ◽  
Alexei O. Orlov ◽  
Gregory L. Snider
2009 ◽  
Vol 23 (12n13) ◽  
pp. 2647-2654 ◽  
Author(s):  
C. STAMPFER ◽  
E. SCHURTENBERGER ◽  
F. MOLITOR ◽  
J. GÜTTINGER ◽  
T. IHN ◽  
...  

We report on electronic transport experiments on a graphene single electron transistor as function of a perpendicular magnetic field. The device, which consists of a graphene island connected to source and drain electrodes via two narrow graphene constrictions is electronically characterized and the device exhibits a characteristic charging energy of approx. 3.5 meV. We investigate the homogeneity of the two graphene "tunnel" barriers connecting the single electron transistor to source and drain contacts as function of laterally applied electric fields, which are also used to electrostatically tune the overall device. Further, we focus on the barrier transparency as function of an applied perpendicular magnetic field and we find an increase of transparency for increasing magnetic field and a source-drain current saturation for magnetic fields exceeding 5 T.


2006 ◽  
Vol 961 ◽  
Author(s):  
Christian Dubuc ◽  
Jacques Beauvais ◽  
Dominique Drouin

ABSTRACTWe report a single-electron transistor concept and its related process enabling the fabrication of ultrasmall junction capacitance. The method utilizes a nanodamascene approach where trenches in silicon oxide are covered with a filling material and planarized with chemical mechanical polishing. Single-electron transistors fabricated with this approach were characterized up to 433 K and demonstrated that the nanodamascene process has high resolution, is relatively simple and is highly scalable.


1997 ◽  
Vol 36 (Part 1, No. 6B) ◽  
pp. 4147-4150 ◽  
Author(s):  
Hironobu Fukui ◽  
Minoru Fujishima ◽  
Koichiro Hoh

2005 ◽  
Vol 36 (3-6) ◽  
pp. 272-276 ◽  
Author(s):  
Kameshwar K. Yadavalli ◽  
Alexei O. Orlov ◽  
Gregory L. Snider ◽  
Jeffrey Elam

2016 ◽  
Vol 6 (5) ◽  
Author(s):  
M. Taupin ◽  
E. Mannila ◽  
P. Krogstrup ◽  
V. F. Maisi ◽  
H. Nguyen ◽  
...  

2001 ◽  
Vol 44 (10S) ◽  
pp. 113-116 ◽  
Author(s):  
V A Krupenin ◽  
A B Zorin ◽  
D E Presnov ◽  
M N Savvateev ◽  
J Niemeyer

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