Effect of interface roughness on silicon-on-insulator–metal-semiconductor field-effect transistor mobility and the device low-power high-frequency operation
2005 ◽
Vol 23
(4)
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pp. 1782
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2021 ◽
Vol 9
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pp. 286-294
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2003 ◽
Vol 20
(5)
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pp. 767-769
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2020 ◽
Vol 9
(8)
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pp. 758-762
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