Fully tensile strained partial silicon-on-insulator n-type lateral-double-diffused metal-oxide-semiconductor field effect transistor using localized contact etching stop layers
2003 ◽
Vol 20
(5)
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pp. 767-769
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2008 ◽
Vol 47
(11)
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pp. 8297-8304
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2011 ◽
Vol 50
(11R)
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pp. 110210
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2009 ◽
Vol 48
(7)
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pp. 071204
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2010 ◽
Vol 49
(4)
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pp. 044303
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2004 ◽
Vol 43
(10)
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pp. 6943-6947
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