Comment on “Quantitative analysis of annealing-induced structure disordering in ion-implanted amorphous silicon,” by Ju-Yin Chenget al., J. Vacuum Science and Technology A20, 1855 (2002)
2003 ◽
Vol 21
(3)
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pp. 827-827
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2002 ◽
Vol 20
(6)
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pp. 1855
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Keyword(s):
1981 ◽
Vol 42
(C4)
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pp. C4-779-C4-782
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1997 ◽
Vol 127-128
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pp. 639-642
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Keyword(s):