Quantitative analysis of annealing-induced structure disordering in ion-implanted amorphous silicon
2002 ◽
Vol 20
(6)
◽
pp. 1855
◽
Keyword(s):
2003 ◽
Vol 21
(3)
◽
pp. 827-827
◽
1981 ◽
Vol 42
(C4)
◽
pp. C4-779-C4-782
◽
1997 ◽
Vol 127-128
◽
pp. 639-642
◽
Keyword(s):
Keyword(s):