Real-time, in situ film thickness metrology in a 10 Torr W chemical vapor deposition process using an acoustic sensor
2003 ◽
Vol 21
(3)
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pp. 1055
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1993 ◽
Vol 140
(12)
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pp. 3588-3590
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Real-time growth rate metrology for a tungsten chemical vapor deposition process by acoustic sensing
2001 ◽
Vol 19
(2)
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pp. 621-626
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2002 ◽
Vol 20
(6)
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pp. 2351
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1995 ◽
Vol 13
(6)
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pp. 2698-2702
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2004 ◽
Vol 22
(3)
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pp. 880
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2019 ◽
Vol 9
(2)
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pp. 119-126
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2009 ◽
Vol 17
(5)
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pp. 1228-1235
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