Real-time, in situ film thickness metrology in a 10 Torr W chemical vapor deposition process using an acoustic sensor

Author(s):  
L. Henn-Lecordier ◽  
J. N. Kidder ◽  
G. W. Rubloff ◽  
C. A. Gogol ◽  
A. Wajid
2019 ◽  
Vol 9 (2) ◽  
pp. 119-126 ◽  
Author(s):  
Sivamaran Venkatesan ◽  
Balasubramanian Visvalingam ◽  
Gopalakrishnan Mannathusamy ◽  
Viswabaskaran Viswanathan ◽  
A. Gourav Rao

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