Single-electron transistor structures based on silicon-on-insulator silicon nanowire fabrication by scanning probe lithography and wet etching

2002 ◽  
Vol 20 (6) ◽  
pp. 2824 ◽  
Author(s):  
J. T. Sheu ◽  
K. S. You ◽  
C. H. Wu ◽  
K. M. Chang
Keyword(s):  
Silicon Nanowire ◽  
Wet Etching ◽  
Silicon On Insulator ◽  
Scanning Probe ◽  
Single Electron ◽  
Single Electron Transistor ◽  
Scanning Probe Lithography

scholarly journals In-plane gate single-electron transistor in Ga[Al]As fabricated by scanning probe lithography

1999 ◽  
Vol 75 (16) ◽  
pp. 2452-2454 ◽  
Author(s):  
S. Lüscher ◽  
A. Fuhrer ◽  
R. Held ◽  
T. Heinzel ◽  
K. Ensslin ◽  
...  
Keyword(s):  
Scanning Probe ◽  
Single Electron ◽  
Single Electron Transistor ◽  
Scanning Probe Lithography

Single-Electron Transistor in Silicon-on-Insulator with Schottky-Contact Tunnel Barriers

1997 ◽  
Vol 36 (Part 1, No. 6B) ◽  
pp. 4147-4150 ◽  
Author(s):  
Hironobu Fukui ◽  
Minoru Fujishima ◽  
Koichiro Hoh
Keyword(s):  
Schottky Contact ◽  
Silicon On Insulator ◽  
Single Electron ◽  
Single Electron Transistor ◽  
Tunnel Barriers

Enhancement of Coulomb blockade and tunability by multidot coupling in a silicon-on-insulator-based single-electron transistor

1999 ◽  
Vol 75 (4) ◽  
pp. 566-568 ◽  
Author(s):  
J. W. Park ◽  
K. S. Park ◽  
B. T. Lee ◽  
C. H. Lee ◽  
S. D. Lee ◽  
...  
Keyword(s):  
Coulomb Blockade ◽  
Silicon On Insulator ◽  
Single Electron ◽  
Single Electron Transistor
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