Nonmetallic Conduction Property of a DNA Templated Gold Nanowire

2007 ◽  
Author(s):  
Takashi Kodama ◽  
Ankur Jain ◽  
Kenneth E. Goodson
Keyword(s):  
Thermal Conduction ◽  
Effective Conductivity ◽  
Physical Property ◽  
Gold Layer ◽  
Temperature Dependent ◽  
Electron Conduction ◽  
Force Microscopy ◽  
Atomic Force ◽  
Single Dna Molecule ◽  
Lorentz Number

Nanowires based on DNA are exciting materials with several possible applications in nanoelectronics because of the self-assemble capability for the designed nanostructure. In this study, we have carried out electrical and thermal conduction measurements on a metallized single DNA molecule. The measured values of the electrical and thermal conductivity were about 1.42 × 101 S/cm and 149.8 W/mK at room temperature, respectively. The measured value of the Lorentz number was about 3.6 × 10−4, which is incompatible with that predicted by the Wiedemann-Franz law. The temperature dependent electrical conductivity shows that electron transport in metallized DNA occurs by the hopping process similar to that in nonmetallized DNA. Atomic force microscopy reveals nanoscale discontinuities in the gold layer around the DNA. While the gold layer assists the DNA in electron conduction, the overall conduction of the metallized DNA is dominated by the DNA rather than the coating. These results suggest that the DNA is potentially a better thermal conductor than the metal coating and that its effective conductivity may be large. This interesting physical property may make the DNA useful for bioapplications involving significant heat transfer.

Scanning tunneling microscopy and atomic force microscopy: New tools for biology

1989 ◽  
Vol 47 ◽  
pp. 778-779
Author(s):  
CE Bracker ◽  
P. K. Hansma
Keyword(s):  
Physical Property ◽  
Scanning Probe ◽  
Scanning Tunneling ◽  
Small Scale ◽  
Tunneling Microscopy ◽  
Force Microscopy ◽  
New Family ◽  
Small Probe ◽  
Atomic Force ◽  
Transmission Electron

A new family of scanning probe microscopes has emerged that is opening new horizons for investigating the fine structure of matter. The earliest and best known of these instruments is the scanning tunneling microscope (STM). First published in 1982, the STM earned the 1986 Nobel Prize in Physics for two of its inventors, G. Binnig and H. Rohrer. They shared the prize with E. Ruska for his work that had led to the development of the transmission electron microscope half a century earlier. It seems appropriate that the award embodied this particular blend of the old and the new because it demonstrated to the world a long overdue respect for the enormous contributions electron microscopy has made to the understanding of matter, and at the same time it signalled the dawn of a new age in microscopy. What we are seeing is a revolution in microscopy and a redefinition of the concept of a microscope.Several kinds of scanning probe microscopes now exist, and the number is increasing. What they share in common is a small probe that is scanned over the surface of a specimen and measures a physical property on a very small scale, at or near the surface. Scanning probes can measure temperature, magnetic fields, tunneling currents, voltage, force, and ion currents, among others.

Temperature Dependent Structural Evolution of Graphene Layers on 4H-SiC(0001)

2011 ◽  
Vol 679-680 ◽  
pp. 797-800 ◽  
Author(s):  
Sushant Sonde ◽  
Carmelo Vecchio ◽  
Filippo Giannazzo ◽  
Corrado Bongiorno ◽  
Salvatore di Franco ◽  
...  
Keyword(s):  
Electron Microscopy ◽  
Structural Evolution ◽  
Morphological Transformation ◽  
Temperature Dependent ◽  
Microscopy Imaging ◽  
Graphene Layers ◽  
Force Microscopy ◽  
Atomic Force ◽  
Transmission Electron ◽  
Mode Atomic Force Microscopy

In this study we examined the structural evolution of graphene grown on 8° off-axis 4H-SiC(0001) substrates at temperatures from 1600°C to 1700°C in Ar ambient. Morphological transformation of SiC substrate after annealing was examined by Tapping Mode Atomic Force Microscopy. Moreover, by etching-out graphene layers from graphitized SiC substrates in selective trenches we determined the number of graphene layers. Numbers of graphene layers were then independently confirmed by Transmission Electron Microscopy imaging.

scholarly journals The effect of hydrogen etching on 6H-SiC studied by temperature-dependent current-voltage and atomic force microscopy

2004 ◽  
Vol 85 (9) ◽  
pp. 1547-1549 ◽  
Author(s):  
S. Doğan ◽  
D. Johnstone ◽  
F. Yun ◽  
S. Sabuktagin ◽  
J. Leach ◽  
...  
Keyword(s):  
Atomic Force Microscopy ◽  
Temperature Dependent ◽  
Hydrogen Etching ◽  
Force Microscopy ◽  
Atomic Force ◽  
Current Voltage

An in-situ hot stage for temperature-dependent tapping-mode™ atomic force microscopy

1998 ◽  
Vol 69 (9) ◽  
pp. 3245-3250 ◽  
Author(s):  
S. G. Prilliman ◽  
A. M. Kavanagh ◽  
E. C. Scher ◽  
S. T. Robertson ◽  
K. S. Hwang ◽  
...  
Keyword(s):  
Atomic Force Microscopy ◽  
Temperature Dependent ◽  
Tapping Mode ◽  
Force Microscopy ◽  
Atomic Force

X-ray/Atomic Force Microscopy Study of the Temperature-Dependent Multilayer Structure of PTCDI-C8 Films on SiO2

2009 ◽  
Vol 113 (11) ◽  
pp. 4502-4506 ◽  
Author(s):  
Tobias N. Krauss ◽  
Esther Barrena ◽  
Dimas G. de Oteyza ◽  
Xue N. Zhang ◽  
János Major ◽  
...  
Keyword(s):  
Atomic Force Microscopy ◽  
Multilayer Structure ◽  
Microscopy Study ◽  
Atomic Force Microscopy Study ◽  
Temperature Dependent ◽  
X Ray ◽  
Force Microscopy ◽  
Atomic Force

Load Rate and Temperature Dependent Mechanical Properties of the Cortical Neuron and Its Pericellular Layer Measured by Atomic Force Microscopy

Langmuir ◽  
2016 ◽  
Vol 32 (4) ◽  
pp. 1111-1119 ◽  
Author(s):  
Marc Simon ◽  
Maxim Dokukin ◽  
Vivekanand Kalaparthi ◽  
Elise Spedden ◽  
Igor Sokolov ◽  
...  
Keyword(s):  
Mechanical Properties ◽  
Atomic Force Microscopy ◽  
Cortical Neuron ◽  
Temperature Dependent ◽  
Force Microscopy ◽  
Atomic Force ◽  
Load Rate

scholarly journals Time- and Temperature-Dependent Growth Behavior of Ionic Liquids on Au(111) Studied by Atomic Force Microscopy in Ultrahigh Vacuum

2021 ◽  
Vol 125 (37) ◽  
pp. 20439-20449
Author(s):  
Manuel Meusel ◽  
Afra Gezmis ◽  
Simon Jaekel ◽  
Matthias Lexow ◽  
Andreas Bayer ◽  
...  
Keyword(s):  
Atomic Force Microscopy ◽  
Ionic Liquids ◽  
Ultrahigh Vacuum ◽  
Growth Behavior ◽  
Temperature Dependent ◽  
Force Microscopy ◽  
Atomic Force ◽  
Dependent Growth

scholarly journals A study of nickel and cobalt silicides formed in the Ni/Co/Si(1 0 0) system by thermal annealing

2020 ◽  
Vol 0 (0) ◽  
Author(s):  
C. Sedrati ◽  
A. Bouabellou ◽  
A. Kabir ◽  
R. Haddad ◽  
M. Boudissa ◽  
...  
Keyword(s):  
Raman Spectroscopy ◽  
Sheet Resistance ◽  
Annealing Temperature ◽  
X Ray Diffraction ◽  
Temperature Dependent ◽  
X Ray ◽  
Force Microscopy ◽  
Atomic Force ◽  
Sheet Resistance Measurement ◽  
Cobalt Silicides

AbstractIn this work, the Ni/Co/Si system was annealed at temperatures ranging from 300 °C to 800 °C. The samples were characterized by means of X-ray diffraction (XRD), Raman spectroscopy, Rutherford backscattering spectroscopy (RBS), atomic force microscopy (AFM) and sheet resistance measurement. The XRD and Raman spectroscopy results showed that the formation of nickel and cobalt silicides (CoSi, Co2Si, Ni2Si, NiSi, NiSi2, CoSi2) is an annealing temperature dependent diffusion process. The diffusion phenomenon was evidenced by RBS. The low values of the sheet resistance which were correlated with the films surface roughness were attributed to the formation of both CoSi and NiSi phases.

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