X-ray/Atomic Force Microscopy Study of the Temperature-Dependent Multilayer Structure of PTCDI-C8 Films on SiO2

2009 ◽  
Vol 113 (11) ◽  
pp. 4502-4506 ◽  
Author(s):  
Tobias N. Krauss ◽  
Esther Barrena ◽  
Dimas G. de Oteyza ◽  
Xue N. Zhang ◽  
János Major ◽  
...  
2009 ◽  
Vol 206 (8) ◽  
pp. 1727-1730 ◽  
Author(s):  
Heinz-Georg Flesch ◽  
Oliver Werzer ◽  
Martin Weis ◽  
Ján Jakabovič ◽  
Jaroslav Kováč ◽  
...  

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