An in-situ hot stage for temperature-dependent tapping-mode™ atomic force microscopy

1998 ◽  
Vol 69 (9) ◽  
pp. 3245-3250 ◽  
Author(s):  
S. G. Prilliman ◽  
A. M. Kavanagh ◽  
E. C. Scher ◽  
S. T. Robertson ◽  
K. S. Hwang ◽  
...  
Keyword(s):  
Atomic Force Microscopy ◽  
Temperature Dependent ◽  
Tapping Mode ◽  
Force Microscopy ◽  
Atomic Force

scholarly journals Structural Evidence for α-Synuclein Fibrils Using in Situ Atomic Force Microscopy

2005 ◽  
Vol 37 (2) ◽  
pp. 113-118
Author(s):  
Feng Zhang ◽  
Li-Na Ji ◽  
Lin Tang ◽  
Jun Hu ◽  
Hong-Yu Hu ◽  
...  
Keyword(s):  
Atomic Force Microscopy ◽  
Guanidine Hydrochloride ◽  
Indirect Evidence ◽  
Contact Mode ◽  
Microscopy Imaging ◽  
Tapping Mode ◽  
Force Microscopy ◽  
Atomic Force ◽  
Mode Atomic Force Microscopy

Abstract Human α-synuclein is a presynaptic terminal protein and can form insoluble fibrils that are believed to play an important role in the pathogenesis of several neurodegenerative diseases such as Parkinson's disease, dementia with Lewy bodies and Lewy body variant of Alzheimer's disease. In this paper, in situ atomic force microscopy has been used to study the structural properties of α-synuclein fibrils in solution using two different atomic force microscopy imaging modes: tapping mode and contact mode. In the in situ contact mode atomic force microscopy experiments α-synuclein fibrils quickly broke into fragments, and a similar phenomenon was found using tapping mode atomic force microscopy in which α-synuclein fibrils were incubated with guanidine hydrochloride (0.6 M). The α-synuclein fibrils kept their original filamentous topography for over 1 h in the in situ tapping mode atomic force microscopy experiments. The present results provide indirect evidence on how β-sheets assemble into α-synuclein fibrils on a nanometer scale.

In-situ investigations on the SILAR-growth of ZnS films as studied by tapping mode atomic force microscopy

1997 ◽  
Vol 358 (1-2) ◽  
pp. 80-84 ◽  
Author(s):  
R. Resch ◽  
G. Friedbacher ◽  
M. Grasserbauer ◽  
T. Kanniainen ◽  
S. Lindroos ◽  
...  
Keyword(s):  
Atomic Force Microscopy ◽  
Tapping Mode ◽  
Force Microscopy ◽  
Atomic Force ◽  
Zns Films ◽  
Mode Atomic Force Microscopy

In Situ Monitoring of Dispersion Film Formation Using Tapping-Mode Atomic Force Microscopy

2004 ◽  
Vol 838 ◽  
Author(s):  
Jing Li ◽  
Wenbin Liang ◽  
Steve Chum
Keyword(s):  
Particle Size ◽  
Atomic Force Microscopy ◽  
Film Formation ◽  
Formation Temperature ◽  
Tapping Mode ◽  
Force Microscopy ◽  
Atomic Force ◽  
Poly Ethylene ◽  
Mode Atomic Force Microscopy

ABSTRACTThe coalescence process of poly (ethylene-co-vinyl acetate) (EVA) and poly (ethylene-co-octene) (EO) dispersion particles was monitored in situ using tapping-mode atomic force microscopy (TMAFM) equipped with a miniature hot stage. This work describes the effect of particle size on the film formation temperature based on direct experimental observation, clarifying further the debate about particle size effect on minimum film formation temperature (MFFT). The results suggest that semicrystalline polyolefin particles have similar deformation temperature dependence. Smaller particles tend to deform faster than larger particles, which is attributed to their smaller mass. Furthermore, morphology changes and mechanical property development associated with the film formation process are also discussed. The TMAFM technique is shown to be very useful in gaining insight into the film formation mechanism, which will provide guidance in future practical applications with polyolefin dispersions.

An in Situ Study of Metal Complexation by an Immobilized Synthetic Biopolymer Using Tapping Mode Liquid Cell Atomic Force Microscopy

2001 ◽  
Vol 73 (17) ◽  
pp. 4087-4095 ◽  
Author(s):  
Thomasin C. Miller ◽  
Eun-Soo Kwak ◽  
Maury E. Howard ◽  
David A. Vanden Bout ◽  
James A. Holcombe
Keyword(s):  
Atomic Force Microscopy ◽  
Metal Complexation ◽  
Tapping Mode ◽  
Force Microscopy ◽  
In Situ Study ◽  
Atomic Force ◽  
Liquid Cell

Atomic force microscopy of in situ deformed nickel thin films

1999 ◽  
Vol 353 (1-2) ◽  
pp. 194-200 ◽  
Author(s):  
C. Coupeau ◽  
J.F. Naud ◽  
F. Cleymand ◽  
P. Goudeau ◽  
J. Grilhé
Keyword(s):  
Thin Films ◽  
Atomic Force Microscopy ◽  
Force Microscopy ◽  
Nickel Thin Films ◽  
Atomic Force
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