Failure Analysis of Liquid Crystal Displays Due to Indium Tin Oxide Breakdown

1999 ◽  
Vol 121 (2) ◽  
pp. 126-127 ◽  
Author(s):  
T. J. Dishoungh ◽  
M. Dube ◽  
M. Pecht ◽  
J. Wyler
Keyword(s):  
Liquid Crystal ◽  
Failure Analysis ◽  
Tin Oxide ◽  
Indium Tin Oxide ◽  
Liquid Crystal Displays ◽  
Oxide Breakdown

Refractive-Index-Matched Indium–Tin-Oxide Electrodes for Liquid Crystal Displays

2009 ◽  
Vol 48 (12) ◽  
pp. 120203 ◽  
Author(s):  
Xing Yan ◽  
Frank W. Mont ◽  
David J. Poxson ◽  
Martin F. Schubert ◽  
Jong Kyu Kim ◽  
...  
Keyword(s):  
Refractive Index ◽  
Liquid Crystal ◽  
Tin Oxide ◽  
Indium Tin Oxide ◽  
Liquid Crystal Displays ◽  
Oxide Electrodes

scholarly journals Optimization of Indium Recovery and Separation from LCD Waste by Solvent Extraction with Bis(2-ethylhexyl) Phosphate (D2EHPA)

2014 ◽  
Vol 2014 ◽  
pp. 1-9 ◽  
Author(s):  
Jiaxu Yang ◽  
Christian Ekberg ◽  
Teodora Retegan
Keyword(s):  
Liquid Crystal ◽  
Tin Oxide ◽  
Indium Tin Oxide ◽  
Liquid Crystal Displays ◽  
Extractant Concentration ◽  
Extraction And Separation ◽  
Effects Of Ph ◽  
Aqueous Feed ◽  
Temperature Time ◽  
Panel Glass

Indium tin oxide (ITO) is currently the choice of electrode material in liquid crystal displays (LCDs). D2EHPA is known to be an extractant that can be used to selectively recover indium from 1 M sulfuric acid. In order to optimize the extraction and separation of indium from LCD waste, the effects of pH, temperature, time, and extractant concentration on the distribution ratios of In(III) and the major impurities such as Al(III), Cu(II), Fe(III), and Zn(II) were investigated. Metal concentrations in the aqueous feed were based on the concentrations found in the leach liquor of LCD panel glass at 0.1 g/mL S/L ratio. This study showed that extraction of indium could be increased at <293 K and stripping of indium could be increased at >293 K. Furthermore, by increasing D2EHPA concentration from 0.1 M to 0.25 M, extraction of indium could be increased from 70% to >95%.

Application of ultra-thin indium–tin–oxide film in liquid crystal lens

2019 ◽  
Vol 119 ◽  
pp. 105603 ◽  
Author(s):  
Che Ju Hsu ◽  
Kaushlendra Agrahari ◽  
Pravinraj Selvaraj ◽  
Wei Fan Chiang ◽  
Chia Yi Huang ◽  
...  
Keyword(s):  
Liquid Crystal ◽  
Oxide Film ◽  
Tin Oxide ◽  
Indium Tin Oxide ◽  
Liquid Crystal Lens

The Mechanical Reliability of Sputter-Coated Indium Tin Oxide Polyester Substrates for Flexible Display and Touchscreen Applications

2001 ◽  
Vol 666 ◽  
Author(s):  
Darran R. Cairns ◽  
David C. Paine ◽  
Gregory P. Crawford
Keyword(s):  
Tin Oxide ◽  
Indium Tin Oxide ◽  
Liquid Crystal Displays ◽  
Mechanical Reliability ◽  
Flexible Display ◽  
Ito Film ◽  
Polyethylene Terephthalate Substrate ◽  
Electrical Reliability ◽  
New Generation ◽  
Over Time

ABSTRACTIndium tin oxide (ITO) films deposited on polyester substrates are a key material in the development of two exciting technologies, touchscreens and flexible liquid crystal displays. The new generation “plastic” displays and touchscreens must be flexible and robust, have excellent optical properties, and be inexpensive. We report on the mechanical and electrical reliability of ITO on a polyethylene terephthalate substrate (PET). We show that the mechanical behavior of the ITO film is dominated by the properties of the substrate and that the deformation of the substrate is mapped by the crack patterns in the ITO. This is most strongly evidenced in the simulated wear of a touchscreen where failure after >50000 pen strokes is primarily due to cracking of the ITO as a result of increased substrate deformation over time. In addition the mechanical reliability of the ITO layer is dependent on the film thickness. Cracking was observed in a 105 nm thick ITO film at a strain of 0.022 and for a 16.8 nm thick film at 0.003. The thickness and hence sheet resistance of the film effectively limits the maximum allowable deformation of the substrate and must be considered in the design of suitable display and touchscreen devices. In addition we report on the change in resistance with time-at- temperature and relate this to the shrinkage of the substrate.

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