A Novel Anisotropic Conductive Adhesive for Lead-Free Surface Mount Electronics Packaging

2006 ◽  
Vol 129 (2) ◽  
pp. 149-156 ◽  
Author(s):  
S. Manian Ramkumar ◽  
Krishnaswami Srihari

The electronics industry, in recent years, has been focusing primarily on product miniaturization and lead-free assembly. The need for product miniaturization is due to the continuous demand for portable electronic products that are multifunctional, yet smaller, faster, cheaper, and lighter. This is forcing the industry to design and assemble products with miniature passive and active devices. These devices typically have fine pitch footprints that provide a very small surface area for attachment. The solder attach technique relies primarily on the formation of intermetallics between the mating metallic surfaces. With a reduction in the surface area of the pads, the ratio of intermetallic to solder is very high once the solder joint is formed. This could result in unreliable solder joints, due to the brittle nature of intermetallics. In addition, the need to eliminate lead-based materials as a means of interconnection has renewed the industry’s interest in exploring other means of assembling surface mount devices reliably. The use of a novel anisotropic conductive adhesive (ACA) as a means for assembling surface mount devices, the ACA’s performance characteristics, and preliminary research findings are discussed in this paper. Typically, ACAs require the application of pressure during the curing process to establish the electrical connection. The novel ACA uses a magnetic field to align the particles in the Z-axis direction and eliminates the need for pressure during curing. The formation of conductive columns within the polymer matrix provides a very high insulation resistance between adjacent conductors. The novel ACA also enables mass curing of the adhesive, eliminating the need for sequential assembly. The novel ACA was found to be very effective in providing the interconnection for surface mount technology (SMT) passives and leaded, bumped, or bumpless integrated circuit packages. The requirement for precise stencil printing was eliminated, as the application of magnetic field aligned the conductive columns in the Z-axis direction eliminating any lateral conductivity. The ability to mass cure the adhesive while applying the magnetic field reduced the assembly time considerably. Placement accuracy was still found to be very critical. Shear testing of adhesive joints after thermal aging showed significance past 500 h and after temperature–humidity aging showed significance within the first 100 h. I–V characteristics of the daisy chained ball grid array devices assembled with and without bumps revealed considerable difference in the breakdown current. The correlation between initial contact resistance of the daisy chain and the final breakdown current was also determined. Preliminary experiments and findings, discussed in this paper, show the viability of the ACA for mixed SMT assembly. Further experimentations will include in situ contact resistance measurements during thermal aging, temperature–humidity aging, drop testing and thermal shock.

Author(s):  
S. Manian Ramkumar ◽  
Krishnaswami Srihari

The electronics industry, in recent years, has been focusing primarily on product miniaturization and lead-free assembly. The need for product miniaturization is due to the continuous demand for portable electronic products that are multifunctional, yet smaller, faster, cheaper, and lighter. This is forcing the industry to design and assemble products with miniature passive and active devices. These devices typically have fine pitch footprints that provide a very small surface area for attachment. The solder attach technique relies primarily on the formation of intermetallics between the mating metallic surfaces. With a reduction in the surface area of the pads, the ratio of intermetallic to solder is very high once the solder joint is formed. This could result in unreliable solder joints, due to the brittle nature of intermetallics. In addition, the need to eliminate lead-based materials as a means of interconnection has renewed the industry’s interest in exploring other means of assembling surface mount devices reliably. This paper discusses the performance characteristics and preliminary research findings pertaining to a novel Anisotropic Conductive Adhesive (ACA) for electronics packaging applications, utilizing the Z Bond™ technology from Nexaura Systems, LLC. Typically, ACAs require the application of pressure during the curing process, to establish the electrical connection. The novel ACA uses a magnetic field to align the particles in the Z-axis direction and eliminates the need for pressure during curing. The formation of conductive columns within the polymer matrix provides a very high insulation resistance between adjacent conductors. The novel ACA also enables mass curing of the adhesive, eliminating the need for sequential assembly. The novel ACA’s I-V characteristics and performance under thermal and temperature-humidity aging are discussed in detail.


Author(s):  
S. Manian Ramkumar ◽  
Krishnaswami Srihari

The need to eliminate lead-based materials as a means of interconnection has renewed the electronics industry’s interest in using conductive adhesives for component attach, especially Anisotropic Conductive Adhesives (ACA). Typical ACAs require the application of pressure during the curing process, to establish the electrical connection and also to capture a monolayer of conductive particles between the mating surfaces. The novel ACA discussed in this paper uses a magnetic field to align the particles in the Z-axis direction during curing and eliminates the need for pressure. The application of the magnetic field allows for the formation of conductive chains between the mating surfaces, thereby eliminating lateral conductivity. This uniqueness of the novel ACA also accommodates for any coplanarity error and the formation of effective Z-axis conductivity, with a variety of lead and bump shapes. The novel ACA also enables mass curing of the adhesive, eliminating the need for sequential assembly. As part of the study presented in this paper, the conductive chains were modeled as series and parallel resistor networks in an insulating adhesive matrix. The number of particles in the chain and hence the number of interfaces between the particles is found to influence the initial contact resistance of the joints. The interfacial resistance is derived from the experimental run. Area array packages with and without bumps, reveal varying contact resistances as indicated by the model and experiment. This paper will present a model for the conductive chain formation in the novel ACA, and discuss the experimental results obtained to verify the joint contact resistance.


MRS Advances ◽  
2016 ◽  
Vol 1 (51) ◽  
pp. 3459-3464
Author(s):  
Sanna Lahokallio ◽  
Laura Frisk

ABSTRACTThe high-temperature performance of electronics packages was studied at 180°C, 200°C and 240°C for 3,000h. The structure tested consisted of a fairly large silicon chip attached with anisotropic conductive adhesive (ACA) onto an adhesiveless PI substrate. These structures showed good electrical reliability at 180°C. Several early failures were seen at the other temperatures. However, only 23% of the test samples failed at 200°C, while considerably more failures were seen at 240°C. The results showed that good high-temperature reliability can be achieved with polymer interconnections. However, the exposure time should be limited, especially at very high temperatures, to avoid failures caused by the materials becoming brittle.


2008 ◽  
Vol 130 (2) ◽  
Author(s):  
Melida Chin ◽  
S. Jack Hu ◽  
James R. Barber

Multiple parameters are involved in the design of anisotropic conductive adhesive assemblies, and the overlapping influences that they have on the final electrical contact resistance represent a difficult challenge for the designers. The most important parameters include initial bonding force F, number of particles N, the adhesion strength GA, and modulus of elasticity E of the cured resin. It is well known that as the bonding force increases, the contact resistance decreases. However, when the bonding force reaches a certain maximum value, the contact between conductive particle and conductive track is disrupted due to delamination of the cured resin during the elastic recovery. The authors have shown in previous studies that the delamination is caused by high residual stresses and that it largely depends on the adhesion strength of the assembly and on the modulus of elasticity of the cured resin. Additionally, the authors have provided a methodology to quantify the maximum threshold value of the bonding force for different numbers of particles trapped between mating conductive tracks. In this paper, the relationships between contact resistance R and each one of these parameters are systematically investigated to create diagrams that give regions of robust design. Given the number of particles and their size, adhesion strength, and modulus of elasticity of the resin, the required bonding force can be found in order to achieve a desired range in contact resistance.


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