Hafnium silicate formation during the reaction of β‐cristobalite SiO
2
and monoclinic HfO
2
particles
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Electrical Characterization of Postmetal Annealed Ultrathin TiN Gate Electrodes in Si MOS Capacitors
2016 ◽
Vol 2016
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pp. 1-4
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2014 ◽
Vol 453
◽
pp. 100-106
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2009 ◽
Vol 27
(4)
◽
pp. 937-942
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2020 ◽
Vol 989
◽
pp. 221-227
◽
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