scholarly journals Hafnium silicate formation during the reaction of β‐cristobalite SiO 2 and monoclinic HfO 2 particles

2020 ◽  
Vol 103 (9) ◽  
pp. 5400-5410
Author(s):  
Jeroen A. Deijkers ◽  
Haydn N.G. Wadley
2003 ◽  
Vol 425 (1-2) ◽  
pp. 68-71 ◽  
Author(s):  
P Punchaipetch ◽  
G Pant ◽  
M Quevedo-Lopez ◽  
H Zhang ◽  
M El-Bouanani ◽  
...  

2004 ◽  
Vol 14 (3) ◽  
pp. 391 ◽  
Author(s):  
John L. Roberts ◽  
Paul A. Marshall ◽  
Anthony C. Jones ◽  
Paul R. Chalker ◽  
Jamie F. Bickley ◽  
...  

2001 ◽  
Vol 79 (25) ◽  
pp. 4192-4194 ◽  
Author(s):  
M. Quevedo-Lopez ◽  
M. El-Bouanani ◽  
S. Addepalli ◽  
J. L. Duggan ◽  
B. E. Gnade ◽  
...  
Keyword(s):  

2006 ◽  
Vol 89 (5) ◽  
pp. 051921 ◽  
Author(s):  
C. Driemeier ◽  
J. J. Chambers ◽  
L. Colombo ◽  
I. J. R. Baumvol
Keyword(s):  

2016 ◽  
Vol 2016 ◽  
pp. 1-4 ◽  
Author(s):  
Z. N. Khan ◽  
S. Ahmed ◽  
M. Ali

Focusing on sub-10 nm Silicon CMOS device fabrication technology, we have incorporated ultrathin TiN metal gate electrode in Hafnium Silicate (HfSiO) based metal-oxide capacitors (MOSCAP) with carefully chosen Atomic Layer Deposition (ALD) process parameters. Gate element of the device has undergone a detailed postmetal annealed sequence ranging from 100°C to 1000°C. The applicability of ultrathin TiN on gate electrodes is established through current density versus voltage (J-V), resistance versus temperature (R-T), and permittivity versus temperature analysis. A higher process window starting from 600°C was intentionally chosen to understand the energy efficient behavior expected from ultrathin gate metallization and its unique physical state with shrinking thickness. The device characteristics in form of effective electronic mobility as a function of inverse charge density were also found better than those conventional gate stacks used for EOT scaling.


2014 ◽  
Vol 453 ◽  
pp. 100-106 ◽  
Author(s):  
L. Khomenkova ◽  
Y.-T. An ◽  
D. Khomenkov ◽  
X. Portier ◽  
C. Labbé ◽  
...  

2009 ◽  
Vol 54 (2) ◽  
pp. 637-642
Author(s):  
Dong Chan Suh ◽  
Dae-Hong Ko ◽  
Mann-Ho Cho ◽  
Kwun Bum Chung
Keyword(s):  

2020 ◽  
Vol 989 ◽  
pp. 221-227 ◽  
Author(s):  
O.Yu. Sheshukov ◽  
I.V. Nekrasov ◽  
Denis K. Egiazaryan

Synthesis of the portland cement clinker in the presence of a significant amount of SO3 is difficult, due to the tri-calcium silicate formation suppression. Since some technogenic formations contain a significant amount of SO3, it is hard to obtain the portland cement clinker from it. The analysis of the SO3 influence on the clinker-formation thermodynamic process allowed to reveal a number of regularities of their occurrence and to propose a method for the raw mix composition calculating and its preparation, to ensure a stable portland cement clinker synthesis.


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