scholarly journals Spectroscopic and structural investigation of undoped and Er3+ doped hafnium silicate layers

2014 ◽  
Vol 453 ◽  
pp. 100-106 ◽  
Author(s):  
L. Khomenkova ◽  
Y.-T. An ◽  
D. Khomenkov ◽  
X. Portier ◽  
C. Labbé ◽  
...  
2019 ◽  
Vol 1 (5) ◽  
pp. 633-644 ◽  
Author(s):  
Martine Claes ◽  
Vasile Paraschiv ◽  
Dries Dictus ◽  
Thierry Conard ◽  
Werner Boullart ◽  
...  

2006 ◽  
Vol 153 (4) ◽  
pp. F60 ◽  
Author(s):  
M. Claes ◽  
V. Paraschiv ◽  
D. Dictus ◽  
T. Conard ◽  
A. Delabie ◽  
...  

Coatings ◽  
2021 ◽  
Vol 11 (7) ◽  
pp. 753
Author(s):  
Eduard N. Sirjita ◽  
Laurentiu Rusen ◽  
Simona Brajnicov ◽  
Cristina Craciun ◽  
Valentin Ion ◽  
...  

We report on the deposition and characterization of hafnium silicate and aluminium silicate thin films for different applications in optics and electronics. Pulsed laser deposition in a controllable oxygen atmosphere was used as a processing technique, with optimized parameters in terms of laser wavelength, laser fluence and oxygen pressure. The thin films were investigated using atomic force microscopy, spectroscopic ellipsometry, UV–VIS spectroscopy and X-ray photoelectron spectroscopy. The morphological investigations evidenced uniform layers with low roughness (in the order of nanometres). The optical investigations revealed that aluminium silicate layers with low roughness and low absorption in the infrared (IR) range can be obtained at high substrate temperatures (600 °C). The behaviour of the silicate thin films with respect to the nanosecond IR laser irradiation revealed that aluminium silicate layers have higher laser-induced damage threshold values in comparison with hafnium silicate.


Author(s):  
W. W. Barker ◽  
W. E. Rigsby ◽  
V. J. Hurst ◽  
W. J. Humphreys

Experimental clay mineral-organic molecule complexes long have been known and some of them have been extensively studied by X-ray diffraction methods. The organic molecules are adsorbed onto the surfaces of the clay minerals, or intercalated between the silicate layers. Natural organo-clays also are widely recognized but generally have not been well characterized. Widely used techniques for clay mineral identification involve treatment of the sample with H2 O2 or other oxidant to destroy any associated organics. This generally simplifies and intensifies the XRD pattern of the clay residue, but helps little with the characterization of the original organoclay. Adequate techniques for the direct observation of synthetic and naturally occurring organoclays are yet to be developed.


Author(s):  
Alfred Baltz

As part of a program to develop iron particles for next generation recording disk medium, their structural properties were investigated using transmission electron microscopy and electron diffraction. Iron particles are a more desirable recording medium than iron oxide, the most widely used material in disk manufacturing, because they offer a higher magnetic output and a higher coercive force. The particles were prepared by a method described elsewhere. Because of their strong magnetic interaction, a method had to be developed to separate the particles on the electron microscope grids.


2017 ◽  
Vol 62 (2) ◽  
pp. 19-28
Author(s):  
Onuc Cozar ◽  
◽  
Nicolae Cioica ◽  
Elena Mihaela Nagy ◽  
Constantin Coţa ◽  
...  

2016 ◽  
Vol 12 (1) ◽  
pp. 4141-4144
Author(s):  
Garima Jain

Polycrystalline films of tin telluride were prepared by sintering technique. The structural investigation of the films with different thicknesses enables to determine lattice parameter, crystallite size and strain existing in the films. The XRD traces showed that strain was tensile in nature. The crystallite size increases with thickness while strain decreases. Higher the value of tensile strain, larger is the lattice constant. The optical energy gap shows a descending nature with increasing strain and so with the lattice constant. Such an attempt made to delve into interdependence of basic physical quantities helps to explore the properties of SnTe and utilize it as an alternative to heavy metal chalcogenides in various technological applications.  


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