On test set generation for efficient path delay fault diagnosis

Proceedings 18th IEEE VLSI Test Symposium ◽

10.1109/vtest.2000.843864 ◽

2002 ◽

Cited By ~ 10

Author(s):

R.C. Tekumalla

Keyword(s):

Fault Diagnosis ◽

Path Delay ◽

Test Set ◽

Delay Fault ◽

Path Delay Fault

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Non-enumerative path delay fault diagnosis [logic testing]

2003 Design, Automation and Test in Europe Conference and Exhibition ◽

10.1109/date.2003.1253627 ◽

2003 ◽

Cited By ~ 5

Author(s):

S. Padmanaban ◽

S. Tragoudas

Keyword(s):

Fault Diagnosis ◽

Path Delay ◽

Delay Fault ◽

Logic Testing ◽

Path Delay Fault

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Path delay fault diagnosis and coverage-a metric and an estimation technique

IEEE Transactions on Computer-Aided Design of Integrated Circuits and Systems ◽

10.1109/43.913761 ◽

2001 ◽

Vol 20 (3) ◽

pp. 440-457 ◽

Cited By ~ 25

Author(s):

M. Sivaraman ◽

A.J. Strojwas

Keyword(s):

Fault Diagnosis ◽

Estimation Technique ◽

Path Delay ◽

Delay Fault ◽

Path Delay Fault

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Path delay fault diagnosis using path scoring

2008 International SoC Design Conference ◽

10.1109/socdc.2008.4815718 ◽

2008 ◽

Author(s):

Yoseop Lim ◽

Joohwan Lee ◽

Sungho Kang

Keyword(s):

Fault Diagnosis ◽

Path Delay ◽

Delay Fault ◽

Path Delay Fault

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An adaptive path delay fault diagnosis methodology [logic IC testing]

International Symposium on Signals Circuits and Systems Proceedings SCS 2003 (Cat No 03EX720) ISQED-04 ◽

10.1109/isqed.2004.1283721 ◽

2004 ◽

Cited By ~ 9

Author(s):

S. Padmanaban ◽

S. Tragoudas

Keyword(s):

Fault Diagnosis ◽

Path Delay ◽

Delay Fault ◽

Path Delay Fault ◽

Ic Testing

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Path delay fault diagnosis in combinational circuits with implicit fault enumeration

IEEE Transactions on Computer-Aided Design of Integrated Circuits and Systems ◽

10.1109/43.952739 ◽

2001 ◽

Vol 20 (10) ◽

pp. 1226-1235 ◽

Cited By ~ 20

Author(s):

P. Pant ◽

Yuan-Chieh Hsu ◽

S.K. Gupta ◽

A. Chatterjee

Keyword(s):

Fault Diagnosis ◽

Path Delay ◽

Combinational Circuits ◽

Delay Fault ◽

Path Delay Fault

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Path Delay Fault Test Set for Two-Rail Logic Circuits

10.1109/prdc.2008.8 ◽

2008 ◽

Cited By ~ 1

Author(s):

Kazuteru Namba ◽

Hideo Ito

Keyword(s):

Logic Circuits ◽

Path Delay ◽

Test Set ◽

Delay Fault ◽

Path Delay Fault

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An implicit path-delay fault diagnosis methodology

IEEE Transactions on Computer-Aided Design of Integrated Circuits and Systems ◽

10.1109/tcad.2003.818132 ◽

2003 ◽

Vol 22 (10) ◽

pp. 1399-1408 ◽

Cited By ~ 20

Author(s):

S. Padmanaban ◽

S. Tragoudas

Keyword(s):

Fault Diagnosis ◽

Path Delay ◽

Delay Fault ◽

Path Delay Fault

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Path-delay fault diagnosis in non-scan sequential circuits with at-speed test application

Proceedings International Test Conference 2000 (IEEE Cat. No.00CH37159) ◽

10.1109/test.2000.894212 ◽

2002 ◽

Cited By ~ 7

Author(s):

P. Pant ◽

A. Chatterjee

Keyword(s):

Fault Diagnosis ◽

Sequential Circuits ◽

Path Delay ◽

Delay Fault ◽

Speed Test ◽

Test Application ◽

Path Delay Fault

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A new classification of path-delay fault testability in terms of stuck-at faults

Journal of Computer Science and Technology ◽

10.1007/bf02973460 ◽

2004 ◽

Vol 19 (6) ◽

pp. 955-964 ◽

Cited By ~ 2

Author(s):

Subhashis Majumder ◽

Bhargab B. Bhattacharya ◽

Vishwani D. Agrawal ◽

Michael L. Bushnell

Keyword(s):

Path Delay ◽

New Classification ◽

Delay Fault ◽

Path Delay Fault

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Path Delay Fault Classification

Frontiers in Electronic Testing - Delay Fault Testing for VLSI Circuits ◽

10.1007/978-1-4615-5597-1_5 ◽

1998 ◽

pp. 45-76

Author(s):

Angela Krstić ◽

Kwang-Ting Cheng

Keyword(s):

Fault Classification ◽

Path Delay ◽

Delay Fault ◽

Path Delay Fault

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