Frontiers in Electronic Testing - Delay Fault Testing for VLSI Circuits
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Published By Springer US

9781461375616, 9781461555971

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Design for Delay Fault Testability

Frontiers in Electronic Testing - Delay Fault Testing for VLSI Circuits ◽

10.1007/978-1-4615-5597-1_8 ◽

1998 ◽

pp. 131-155

Author(s):

Angela Krstić ◽

Kwang-Ting Cheng

Keyword(s):

Delay Fault

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Path Delay Fault Classification

Frontiers in Electronic Testing - Delay Fault Testing for VLSI Circuits ◽

10.1007/978-1-4615-5597-1_5 ◽

1998 ◽

pp. 45-76

Author(s):

Angela Krstić ◽

Kwang-Ting Cheng

Keyword(s):

Fault Classification ◽

Path Delay ◽

Delay Fault ◽

Path Delay Fault

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Test Application Schemes for Testing Delay Defects

Frontiers in Electronic Testing - Delay Fault Testing for VLSI Circuits ◽

10.1007/978-1-4615-5597-1_2 ◽

1998 ◽

pp. 7-22

Author(s):

Angela Krstić ◽

Kwang-Ting Cheng

Keyword(s):

Test Application ◽

Delay Defects

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Conclusions and Future Work

Frontiers in Electronic Testing - Delay Fault Testing for VLSI Circuits ◽

10.1007/978-1-4615-5597-1_10 ◽

1998 ◽

pp. 169-172

Author(s):

Angela Krstić ◽

Kwang-Ting Cheng

Keyword(s):

Future Work

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Test Generation for Path Delay Faults

Frontiers in Electronic Testing - Delay Fault Testing for VLSI Circuits ◽

10.1007/978-1-4615-5597-1_7 ◽

1998 ◽

pp. 101-130

Author(s):

Angela Krstić ◽

Kwang-Ting Cheng

Keyword(s):

Test Generation ◽

Delay Faults ◽

Path Delay ◽

Path Delay Faults

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Introduction

Frontiers in Electronic Testing - Delay Fault Testing for VLSI Circuits ◽

10.1007/978-1-4615-5597-1_1 ◽

1998 ◽

pp. 1-5

Author(s):

Angela Krstić ◽

Kwang-Ting Cheng

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Delay Fault Models

Frontiers in Electronic Testing - Delay Fault Testing for VLSI Circuits ◽

10.1007/978-1-4615-5597-1_3 ◽

1998 ◽

pp. 23-31

Author(s):

Angela Krstić ◽

Kwang-Ting Cheng

Keyword(s):

Fault Models ◽

Delay Fault

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Delay Fault Simulation

Frontiers in Electronic Testing - Delay Fault Testing for VLSI Circuits ◽

10.1007/978-1-4615-5597-1_6 ◽

1998 ◽

pp. 77-100

Author(s):

Angela Krstić ◽

Kwang-Ting Cheng

Keyword(s):

Fault Simulation ◽

Delay Fault

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Case Studies on Delay Testing

Frontiers in Electronic Testing - Delay Fault Testing for VLSI Circuits ◽

10.1007/978-1-4615-5597-1_4 ◽

1998 ◽

pp. 33-44

Author(s):

Angela Krstić ◽

Kwang-Ting Cheng

Keyword(s):

Case Studies ◽

Delay Testing

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Synthesis for Delay Fault Testability

Frontiers in Electronic Testing - Delay Fault Testing for VLSI Circuits ◽

10.1007/978-1-4615-5597-1_9 ◽

1998 ◽

pp. 157-168

Author(s):

Angela Krstić ◽

Kwang-Ting Cheng

Keyword(s):

Delay Fault

Download Full-text

Frontiers in Electronic Testing - Delay Fault Testing for VLSI CircuitsLatest Publications

TOTAL DOCUMENTS

H-INDEX

Published By Springer US

Design for Delay Fault Testability

Path Delay Fault Classification

Test Application Schemes for Testing Delay Defects

Conclusions and Future Work

Test Generation for Path Delay Faults

Introduction

Delay Fault Models

Delay Fault Simulation

Case Studies on Delay Testing

Synthesis for Delay Fault Testability

Frontiers in Electronic Testing - Delay Fault Testing for VLSI Circuits
Latest Publications