DEFUSE: a deterministic functional self-test methodology for processors

Author(s):  
L. Chen ◽  
S. Dey
Keyword(s):  
1995 ◽  
Vol 6 (1) ◽  
pp. 85-106 ◽  
Author(s):  
Oliver F. Haberl ◽  
Thomas Kropf
Keyword(s):  

Author(s):  
Giorgos Theodorou ◽  
Nektarios Kranitis ◽  
Antonis Paschalis ◽  
Dimitris Gizopoulos

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