Simulation-based target test generation techniques for improving the robustness of a software-based-self-test methodology

IEEE International Conference on Test, 2005. ◽

10.1109/test.2005.1584059 ◽

2006 ◽

Author(s):

Charles H.-P. Wen ◽

L.-C. Wang ◽

Kwang-Ting Cheng ◽

Wei-Ting Liu ◽

Ji-Jan Chen

Keyword(s):

Test Generation ◽

Test Methodology ◽

Simulation Based ◽

Self Test

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Test generation, design-for-testability and built-in self-test for arithmetic units based on graph labeling

Journal of Electronic Testing ◽

10.1007/bf00135230 ◽

1991 ◽

Vol 2 (4) ◽

pp. 351-372 ◽

Cited By ~ 37

Author(s):

Abhijit Chatterjee ◽

Jacob A. Abraham

Keyword(s):

Test Generation ◽

Design For Testability ◽

Graph Labeling ◽

Self Test ◽

Arithmetic Units ◽

Built In Self Test

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Simulation-based Adversarial Test Generation for Autonomous Vehicles with Machine Learning Components

2018 IEEE Intelligent Vehicles Symposium (IV) ◽

10.1109/ivs.2018.8500421 ◽

2018 ◽

Cited By ~ 42

Author(s):

Cumhur Erkan Tuncali ◽

Georgios Fainekos ◽

Hisahiro Ito ◽

James Kapinski

Keyword(s):

Machine Learning ◽

Test Generation ◽

Autonomous Vehicles ◽

Simulation Based

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DEFUSE: a deterministic functional self-test methodology for processors

Proceedings 18th IEEE VLSI Test Symposium ◽

10.1109/vtest.2000.843853 ◽

2002 ◽

Cited By ~ 43

Author(s):

L. Chen ◽

S. Dey

Keyword(s):

Test Methodology ◽

Self Test

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SIMULATION BASED LOW POWER TEST GENERATION FOR CROSSTALK DELAY FAULTS

International Journal of Modelling and Simulation ◽

10.2316/journal.205.2011.3.205-5524 ◽

2011 ◽

Vol 31 (3) ◽

Author(s):

Jayanthy Soundararajan ◽

Bhuvaneswari M. Chinnadurai

Keyword(s):

Low Power ◽

Test Generation ◽

Delay Faults ◽

Power Test ◽

Low Power Test ◽

Simulation Based

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An Agency-Directed Approach to Test Generation for Simulation-based Autonomous Vehicle Verification

2020 IEEE International Conference On Artificial Intelligence Testing (AITest) ◽

10.1109/aitest49225.2020.00012 ◽

2020 ◽

Author(s):

Greg Chance ◽

Abanoub Ghobrial ◽

Severin Lemaignan ◽

Tony Pipe ◽

Kerstin Eder

Keyword(s):

Test Generation ◽

Autonomous Vehicle ◽

Simulation Based

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HIST: A hierarchical self test methodology for chips, boards, and systems

Journal of Electronic Testing ◽

10.1007/bf00993132 ◽

1995 ◽

Vol 6 (1) ◽

pp. 85-106 ◽

Cited By ~ 2

Author(s):

Oliver F. Haberl ◽

Thomas Kropf

Keyword(s):

Test Methodology ◽

Self Test

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Enhancement of Adaptive Software-Based Self Test Generation of Embedded Processors Cores

IFAC-PapersOnLine ◽

10.1016/j.ifacol.2019.12.732 ◽

2019 ◽

Vol 52 (27) ◽

pp. 56-61

Author(s):

Ján Hudec

Keyword(s):

Test Generation ◽

Embedded Processors ◽

Adaptive Software ◽

Self Test

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A scalable software-based self-test methodology for programmable processors

10.1109/dac.2003.1219068 ◽

2004 ◽

Cited By ~ 80

Author(s):

Li Chen ◽

S. Ravi ◽

A. Raghunathan ◽

S. Dey

Keyword(s):

Test Methodology ◽

Self Test ◽

Programmable Processors ◽

Scalable Software

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Simulation based test generation for scan designs

IEEE/ACM International Conference on Computer Aided Design. ICCAD - 2000. IEEE/ACM Digest of Technical Papers (Cat. No.00CH37140) ◽

10.1109/iccad.2000.896529 ◽

2002 ◽

Cited By ~ 9

Author(s):

I. Pomeranz ◽

S.M. Reddy

Keyword(s):

Test Generation ◽

Simulation Based

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Software-Based Self Test Methodology for On-Line Testing of L1 Caches in Multithreaded Multicore Architectures

IEEE Transactions on Very Large Scale Integration (VLSI) Systems ◽

10.1109/tvlsi.2012.2191000 ◽

2013 ◽

Vol 21 (4) ◽

pp. 786-790 ◽

Cited By ~ 15

Author(s):

Giorgos Theodorou ◽

Nektarios Kranitis ◽

Antonis Paschalis ◽

Dimitris Gizopoulos

Keyword(s):

Multicore Architectures ◽

Test Methodology ◽

On Line ◽

Self Test

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