scholarly journals A rapid and scalable diagnosis scheme for BIST environments with a large number of scan chains

2002 ◽  
Author(s):  
J. Ghosh-Dastidar ◽  
N.A. Touba
Keyword(s):  
Scan Chains

Diagnose Compound Hold Time Faults Caused by Spot Delay Defects at Clock Tree

2011 ◽  
Author(s):  
Yu Huang ◽  
Wu-Tung Cheng ◽  
Ting-Pu Tai ◽  
Liyang Lai ◽  
Ruifeng Guo ◽  
...  
Keyword(s):  
Hold Time ◽  
Clock Signal ◽  
Clock Tree ◽  
Scan Testing ◽  
Design Error ◽  
Functional Logic ◽  
Scan Chains ◽  
Delay Defects

Abstract If a signal on clock tree is slower than expected due to either a design error or a manufacturing defect, it may cause complicated fault behaviors during scan-based testing. It makes the diagnosis of such defect especially difficult if the defective clock signal is used for both shift and capture operations during the scan testing, because (1) the defect induces hold time faults on scan chains during shift cycles, and (2) hold-time faults may also be introduced during capture cycles in the functional logic paths. In this paper we illustrate the failure behaviors of such clock defects and propose an algorithm to diagnose it.

Design of Test Compression for Multiple Scan Chains Circuits

2021 ◽  
Author(s):  
D Manasa Manikya ◽  
Marala Jagruthi ◽  
Rana Anjum ◽  
Ashok Kumar K
Keyword(s):  
Test Compression ◽  
Multiple Scan ◽  
Scan Chains

An ATE assisted DFD technique for volume diagnosis of scan chains

2013 ◽  
Author(s):  
Subhadip Kundu ◽  
Santanu Chattopadhyay ◽  
Indranil Sengupta ◽  
Rohit Kapur
Keyword(s):  
Scan Chains

scholarly journals A smart test controller for scan chains in secure circuits

2013 ◽  
Author(s):  
Jean Da Rolt ◽  
Giorgio Di Natale ◽  
Marie-Lise Flottes ◽  
Bruno Rouzeyre
Keyword(s):  
Scan Chains

Detection of Internal Stuck-open Faults in Scan Chains

2008 ◽  
Author(s):  
F. Yang ◽  
S. Chakravarty ◽  
N. Devta-Prasanna ◽  
S.M. Reddy ◽  
I. Pomeranz
Keyword(s):  
Open Faults ◽  
Scan Chains
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